Application NotesTopography and Refractive Index Measurement of a Sub-μm Transparent Film on an Electronic Chip by Correlation of Scanning Electron and Confocal Microscopy
Application NotesAvoid Wasted Trips to Your Imaging Core Facility Pre-Screen Your Sample Preps for Fluorescence
Application NotesRaman and Photoluminescence Measurements on Laser Lithographically Written Structures in Silicon