Ultra High Purity Helium Application: <5 ppb Neon in Helium

GOW-MAC Instrument Company, a leading manufacturer of gas analysis instrumentation and compressed gas handling equipment, announces the latest in its series of trace gas analysis application data sheets known as “Peak to Peak Applied Separation Techniques”, concerning the detection of neon in helium.

It’s been assumed in the past that, “If there’s hydrogen, there’s neon.” Today we offer a more definitive statement, “We’ll show you the neon.”

GOW-MAC’s patented Discharge Ionization Detector (DID) and Series 590 Gas Chromatograph, coupled with continuing research and improved instrument and detector design, are providing maximum detectability of permanent gas impurities in helium, including neon.

This latest literature furnishes the user with essential information needed to perform trace gas analysis in the field of neon in helium. The analysis was performed using a primary gas standard containing neon, hydrogen, argon, nitrogen, methane, carbon monoxide and carbon dioxide in a balance of helium. Nominal concentrations of all species were 2.5 ppm. The DID’s detection zone has been optimized in order to provide the maximum detectability (lowest LDL) for each species.

GOW-MAC’s Series 590 GC with DID detects trace gas impurities in the ppb range. Common detectable impurities include H2, Ne, Ar, O2, N2, CH4, CO, and CO2. The GC is well suited for the bulk, specialty and electronic gas industries. The DID is a concentration-dependent universal detector using non-radioactive ionization dynamics to detect sample components.

GOW-MAC Instrument Co. has been the leading manufacturer of gas chromatographs and GC detectors for over 70 years. Customers may visit http://www.gow-mac.com or contact GOW-MAC Instrument Co., 277 Brodhead Road, Bethlehem, PA 18017; Tel (610) 954-9000; Fax (610) 954-0599; or E-mail sales@gow-mac.com for free literature and details.