News & Articles

Precise Fine Focus Microscope Adjustment

Broadening the capability of the most versatile 3D X-ray microscopy instrument

Compact system for surface analysis

Pittcon 2016 – Short Course On Air Monitoring, Technical Presentations and Posters from Markes

Rigaku Publishes New Method for Quantitative Elemental Analysis of Low-Alloy Steel on a Benchtop WDXRF Spectrometer

Ultra-Fast Optical Alignment System for SiP Production from Physik Instrumente Named a Prism Award Finalist

Multiple Uses for The JPK NanoWizard AFM System in The Smart Interfaces in Environmental Nanotechnology Group at The University of Illinois at Urbana-Champaign

Pall Enters Supply Agreement with Kaneka for Sale and Technical Support of KanCapA Protein a Chromatography Sorbent

X-ray Innovation and User-friendly Software Boosts Detection Sensitivity

Kinesis SureStop® Vials – Reduce Sample Evaporation and Extend Autosampler Needle Lifetime

FEI, an early pioneer of Cryo-EM, has made many enabling technological innovations.

Rigaku Publishes Method for Quantitative Analysis of Ferrosilicon by WDXRF

High Performance UV Assay Microplates

By Anahita Pakzad, Gatan, Inc.

Fellowes Brands, manufacturers of premium mobile photography accessories and ZEISS, international optics enterprise, present three new high-performance accessory lenses for mobile phones at the 2016 Consumer Electronics Show in Las Vegas

Joint HORIBA and AIST-NT Solution Provided Spatial Resolution below 15 nm

Prestigious research award to be presented to Fedor Jelezko and Jörg Wrachtrup with an additional award for young researchers

Restek’s new Raptor™ FluoroPhenyl Phase combines the speed of superficially porous particles with the resolution of highly selective USLC® technology

Prior Scientific’s LumaSpec LS800S enables users to characterize and monitor the illumination source of their microscope system