D5000 XRD
D5000 – the first X-ray diffractometer with fully automated beam path
The supplier does not provide quotations for this product through SelectScience. You can search for similar products in our Product Directory.
Structural characterization
This is an excellent instrument. It has the ability to measure all type of samples, from liquids to loose powders, from thin films to solid blocks, on a single instrument.
Review Date: 13 Nov 2023 | Bruker AXS Inc.
Inorganic chemistry
High quality achieved, easy to use software and device.
Review Date: 4 Apr 2022 | Bruker AXS Inc.
Analyze electronic thin films.
Easy and reliable to use with a lot of different features. Modify the recipe.
Review Date: 29 Mar 2022 | Bruker AXS Inc.
D5000 – the first X-ray diffractometer with fully automated beam path