HF-3300 300 kV FE TEM
The HF-3300 300 kV FE TEM is a powerful analytical and high resolution TEM/STEM with inherent high beam brightness, high coherence, high energy resolution, and Hitachi unique functions! Features • High energy-resolution and high beam current • Parallel nanobeam electron diffraction for high precision stress analysis • Spatially-resolved EELS for instant multipoint compositional and chemical binding state analyses • Double-bipr…
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The HF-3300 300 kV FE TEM is a powerful analytical and high resolution TEM/STEM with inherent high beam brightness, high coherence, high energy resolution, and Hitachi unique functions!
Features
• High energy-resolution and high beam current
• Parallel nanobeam electron diffraction for high precision stress analysis
• Spatially-resolved EELS for instant multipoint compositional and chemical binding state analyses
• Double-biprism electron holography for dopant mapping and magnetic and dielectric materials study
• Real-time 3D structural and chemical characterization using Hitachi 3D sample holder
• Built-in STEM, and simultaneous signal collections: HAADF/BF, HAADF/SE, SE/BF, HAADF/EELS
