IRT-5000 FT-IR Microscope
JASCO has developed the IRT-5000, an innovative FT-IR microscope accessory with advanced functionality which drastically improves the ability to obtain micro-spectroscopic data.The IRT-5000 FT-IR Microscope employs a mid-band MCT detector as standard, while up to two detectors can be installed simultaneously to expand the spectral range of the microscope. The standard "IQ Mapping" function allows multi-point, line, area and AT…
The supplier does not provide quotations for this product through SelectScience. You can search for similar products in our Product Directory.
Sample observation and measurement
Very easy to use, it provides a quick and accurate characterization of samples. It is also a great teaching tool for understanding IT spec.satisfied with product. it is sometimes difficult to contact service representatives or tech support.
Review Date: 1 Apr 2022 | JASCO (USA)
research
I have found the general IR spectral analysis software to be very limited in its application not allowing me to do several things which I used to do with win-ir from Bio-Rad which I purchased 25 years ago.
Review Date: 29 May 2013 | JASCO (USA)
Undergraduate research
Very easy to use, it provides a quick and accurate characterization of samples. It is also a great teaching tool for understanding IT spec.
Review Date: 26 Apr 2012 | JASCO (USA)
satisfied with product. it is sometimes difficult to contact service representatives or tech support.
Review Date: 8 Jun 2011 | JASCO (USA)
JASCO has developed the IRT-5000, an innovative FT-IR microscope accessory with advanced functionality which drastically improves the ability to obtain micro-spectroscopic data.
The IRT-5000 FT-IR Microscope employs a mid-band MCT detector as standard, while up to two detectors can be installed simultaneously to expand the spectral range of the microscope. The standard "IQ Mapping" function allows multi-point, line, area and ATR mapping experiments without moving the sample stage, in addition to single-point measurements. An optional automatic X-Y-Z sample stage enables auto-focus and mapping analysis of a large sample area. With the addition of a linear array detector, the microscope can be easily upgraded for IR imaging in the field.
Features
- IQ Mapping without moving sample stage
- Dual detector capability and user replaceable detectors
- Multiple objective capability and automatic switching
- Exceptional visual observation quality
- IQ Monitoring for simultaneous observation of the spectrum and sample image
- Spectrum preview to check conditions before measurement
- Data storage linked with sample image and aperture information