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NANOSTAR

NANOSTAR – Synchrotron SAXS beamline design Brilliant X-ray sources are combined with innovative multi-layer optics, which provides an intense, point-like incident beam upon the sample. Thanks to the 3-pinhole collimation, the background is extremely low, which is a must for the analysis of weakly scattering samples. The VÅNTEC-2000 is a large 2-D detector with true photon counting ability, featuring a maximum performance in a…

Bruker AXS Inc.

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Average Rating 3.8

|4Scientists have reviewed this product

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Great results

 

Average Rating 4.0

Application Area:

Analyze samples

Great tool for sample analysis

Review Date: 15 Nov 2021 | Bruker AXS Inc.

Good results

 

Average Rating 3.0

Application Area:

Liquid crystal polymer

It needs to be aligned perfectly and the calibration of the system is not so easy. The device is so handy, however, the price is not reasonable. In term of the results I recommend it.

Review Date: 16 Dec 2017 | Bruker AXS Inc.

Perfect

 

Average Rating 5.0

Application Area:

laboratory

Satisfied about characteristics and working tool for our application.

Review Date: 22 Dec 2016 | Bruker AXS Inc.

Average Rating 3.3

Application Area:

Materials science

The instrument is very well made. No significant problems after 5 years of usage. Just normal maintenance. After sales service is very helpful and ready to give you assistance for every problem. I would definitely recommend this product to a colleague.

Review Date: 24 Oct 2012 | Bruker AXS Inc.

NANOSTAR – Synchrotron SAXS beamline design

Brilliant X-ray sources are combined with innovative multi-layer optics, which provides an intense, point-like incident beam upon the sample. Thanks to the 3-pinhole collimation, the background is extremely low, which is a must for the analysis of weakly scattering samples. The VÅNTEC-2000 is a large 2-D detector with true photon counting ability, featuring a maximum performance in angular resolution, low background and dynamic range. Such a large 2-dimensional detector is essential for SAXS/GISAXS measurements as it avoids any potential misinterpretation of data, eliminating the need for restrictive initial assumptions about the sample. In fact, the NANOSTAR analyzes pure sample properties, even for non-isotropic sample systems. Additionally, a real space image with µm SAXS resolution of the sample can be taken by performing Nanography.

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