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Phenom ParticleX AM Desktop SEM
Desktop SEM for additive manufacturing analysis, capable of observing large samples up to 100 mm x 100 mm.
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The Thermo Scientific Phenom ParticleX Desktop Scanning Electron Microscope (SEM) is a multi-purpose desktop SEM designed for additive manufacturing, delivering purity at the microscale.
Take in-house control of your data:
- Monitor critical characteristics of metal powders
- Apply to your powder-bed and powder-fed additive manufacturing processes
- Identify particle size distributions, individual particle morphology, and foreign particles
The Phenom ParticleX AM Desktop SEM is equipped with a chamber that allows the analysis of large samples up to 100 mm x 100 mm. A proprietary venting/loading mechanism ensures the fastest vent/load cycle in the world, providing the highest throughput.
Key Features
- General SEM usage: The Phenom ParticleX AM Desktop SEM features a chamber with an accurate and fast motorized stage that allows analysis of samples of up to 100 mm x 100 mm. In spite of this larger sample size, a proprietary loading shuttle keeps the vent/load cycle to an industry-leading sample-loading time of 60 seconds or less. In practice this improves the throughput factors to be greater than other SEM systems.
- Additive manufacturing: The Phenom ParticleX AM Desktop SEM measures various size and shape parameters, such as minimum and maximum diameter, perimeter, aspect ratio, roughness, and feret diameter. All of these can be displayed with 10%, 50%, 90% values (e.g. d10, d50, d90).
- Elemental mapping and line scan: For a user, it is simply click and go to work with the elemental mapping and line scan functionality of the Phenom ParticleX AM Desktop SEM. The line scan functionality shows the quantified element distribution in a line plot. This is especially useful for coatings, paints and other applications with multiple layers for analyzing edges, coatings, cross sections, etc.
- Secondary electron detector: A secondary electron detector (SED) is optionally available on the Phenom ParticleX AM Desktop SEM. The SED collects low-energy electrons from the top surface layer of the sample. It is therefore ideally suited to reveal detailed sample surface information. The SED can be of great use for applications where topography and morphology are important. This is often the case when studying microstructures, fibers or particles.
