For optimal imaging and microanalysis in electron microscopy, it is imperative to have a clean, well-prepared specimen. This is especially true for many modern electron microscopes, which employ high brightness electron sources, such as LaB6 filaments and field emission(FE) guns. Such high brightness systems combine a small electron probe for microanalysis with increased beam current density, giving high resolution specimen im…
Ideal for room temperature electron tomography High tilt in narrow gap pole pieces Optimized specimen retention Extended field of view Easy, accurate specimen positioning The Model 2020 Advanced Tomography Holder is a revolutionary room temperature specimen holder for transmission electron microscopy (TEM) featuring high tilt and extended field of view. It allows data collection over wide tilt and translation ranges…
High-resolution STEM imaging The Model 3000 Annular Dark Field (ADF) Detector is ideal for high-resolution scanning transmission electron microscopy (STEM) imaging. It allows simultaneous high angle ADF imaging and electron energy less spectroscopy (EELS). It has single electron detection capabilities and high quantum efficiency. The detector is pneumatically retractable from the beam path. Atomic-resolution imaging and Z-cont…
Provides clean environment for SEM The Cryo-Can provides a clean environment for SEM sample imaging and analysis. It helps eliminate chamber contamination resulting from sample outgassing and other sources. The Cryo-Can improves both imaging and analytical data quality. It is ideal for high beam current applications. Uses SEM vacuum system The Cryo-Can vacuum container is readily connected to one of the SEM chamber ports and d…
Revolutionary ultra-low-energy, concentrated ion beam Fischione’s Model 1040 NanoMill® TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens needed for advanced transmission electron microscopy (TEM) imaging and analysis. It is ideal for both post-FIB (focused ion beam) processing and the enhancement of conventionally prepared specimens. Targeted, ultra-low-energy NanoMillingsm proce…
High-quality thin foils for TEM Electrolytic thinning of conductive materials is an effective method of quickly producing specimens for transmission electron microscopy (TEM) without any induced artifacts. In the Model 110 Twin-Jet Electropolisher, twin jets simultaneously polish both sides of the sample, creating electron transparent specimens within a few minutes. The Electropolisher features easily adjustable electrolyte fl…
