Materials analysis examines the properties, composition, and behavior of materials at a microscopic and macroscopic level. Using advanced techniques such as microscopy, spectroscopy, and chromatography, materials analysts investigate the structure, purity, and performance of various substances. From industrial materials and nanomaterials to battery testing and beyond, this field provides critical insights into the characteristics and applications of materials across industries such as manufacturing, electronics, and healthcare. Explore how materials analysis drives innovation, quality assurance, and product development for a wide range of applications.
MultiMode 8 Scanning Probe Microscope from Veeco Instruments The World's Highest Resolution, Most Published SPM Just Got Better The MultiMode® 8 Scanning Probe Microscope (SPM) resets the standard for high-performance SPMs. A major advancement of the world's best-selling, most field-proven SPM platform, the MultiMode 8 SPM features two new patent-pending technologies from Veeco, ScanAsyst™ and PeakForce™ QNM™, as well as a sim…
Silicon nitride probes for contact, fluid tapping mode and force measurement, with a variety of extremely low spring constants for high force sensitivity. Sharpened; 6 cantilevers 0.01-0.50N/m; Au Reflective Coating. Tip Specification Sharpened Microlevers Geometry: Cast Tip Height (h): 2.5 - 8.0µm Front Angle (FA): 15 ± 2.5° Back Angle (BA): 25 ± 2.5° Side Angle (SA): 22.5 ± 2.5° Tip Radius (Nom): 10nm Tip Radius (Max): 40nm…
The Dektak® 8 Advanced Development Profiler combines high repeatability, low-force sensor technology, and advanced 3D data analysis for surface characterization of MEMS, semiconductors and other thin/thick films. The system provides 7.5 angstrom, 1 sigma step height repeatability and a vertical range of up to 1mm. Its overhead gantry design enables scan lengths to 200mm, for planarity and flatness measurements.
The Dimension® Edge™ Atomic Force Microscope (AFM) System offers streamlined access to top AFM performance, representing a new level of productivity and attainability for the most advanced nanoscale research. It leverages the many innovations of the Dimension® Icon® System to provide levels of performance and functionality only available from Veeco. Designed from top to bottom to deliver the low drift and low noise necessary t…
Lowest noise, highest resolution Atomic Force Microscope in its classThe Innova atomic force microscope provides more performance and flexibility at a greater value than any other SPM. The proprietary closed-loop scan delivers noise-levels that approach those of high-end, open-loop systems and offers a wide range of functionality for physical, materials, and life sciences, from sub-micron levels up to 90 microns. The Integrate…
