VEECO Instruments Inc. Products & Reviews

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MultiMode 8 Scanning Probe Microscope

VEECO Instruments Inc.

MultiMode 8 Scanning Probe Microscope from Veeco Instruments The World's Highest Resolution, Most Published SPM Just Got Better The MultiMode® 8 Scanning Probe Microscope (SPM) resets the standard for high-performance SPMs. A major advancement of the world's best-selling, most field-proven SPM platform, the MultiMode 8 SPM features two new patent-pending technologies from Veeco, ScanAsyst™ and PeakForce™ QNM™, as well as a sim…

5.0/5.0
|1 Review

MSCT Probes

VEECO Instruments Inc.

Silicon nitride probes for contact, fluid tapping mode and force measurement, with a variety of extremely low spring constants for high force sensitivity. Sharpened; 6 cantilevers 0.01-0.50N/m; Au Reflective Coating. Tip Specification Sharpened Microlevers Geometry: Cast Tip Height (h): 2.5 - 8.0µm Front Angle (FA): 15 ± 2.5° Back Angle (BA): 25 ± 2.5° Side Angle (SA): 22.5 ± 2.5° Tip Radius (Nom): 10nm Tip Radius (Max): 40nm…

3.7/5.0
|1 Review

Dektak® 8 Advanced Development Profiler

VEECO Instruments Inc.

The Dektak® 8 Advanced Development Profiler combines high repeatability, low-force sensor technology, and advanced 3D data analysis for surface characterization of MEMS, semiconductors and other thin/thick films. The system provides 7.5 angstrom, 1 sigma step height repeatability and a vertical range of up to 1mm. Its overhead gantry design enables scan lengths to 200mm, for planarity and flatness measurements.

3.3/5.0
|1 Review

Dimension Edge Atomic Force Microscope System

VEECO Instruments Inc.

The Dimension® Edge™ Atomic Force Microscope (AFM) System offers streamlined access to top AFM performance, representing a new level of productivity and attainability for the most advanced nanoscale research. It leverages the many innovations of the Dimension® Icon® System to provide levels of performance and functionality only available from Veeco. Designed from top to bottom to deliver the low drift and low noise necessary t…

0.0/5.0
|0 Reviews

Innova Scaning Probe Microscope

VEECO Instruments Inc.

Lowest noise, highest resolution Atomic Force Microscope in its classThe Innova atomic force microscope provides more performance and flexibility at a greater value than any other SPM. The proprietary closed-loop scan delivers noise-levels that approach those of high-end, open-loop systems and offers a wide range of functionality for physical, materials, and life sciences, from sub-micron levels up to 90 microns. The Integrate…

0.0/5.0
|0 Reviews