Materials analysis examines the properties, composition, and behavior of materials at a microscopic and macroscopic level. Using advanced techniques such as microscopy, spectroscopy, and chromatography, materials analysts investigate the structure, purity, and performance of various substances. From industrial materials and nanomaterials to battery testing and beyond, this field provides critical insights into the characteristics and applications of materials across industries such as manufacturing, electronics, and healthcare. Explore how materials analysis drives innovation, quality assurance, and product development for a wide range of applications.
K-TEK CSG10 AFM Mode Contact Probe This versatile CSG10 AFM Mode Contact Probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this a must have for any AFM laboratory. Available Options with the CSG10 AFM Mode Contact Probe: -PtIr, TiN, and Au tip coatings -CoCr magnetic tip…
K-TEK CSG11 AFM Mode Contact ProbeThis versatile CSG11 AFM Mode Contact Probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this a must have for any AFM laboratory. Available Options with the CSG11 AFM Mode Contact Probe: -PtIr, TiN, and Au tip coatings -CoCr magnetic tip c…
K-TEK CSG30 AFM Mode Contact, Non Contact, Semi Contact Probe This versatile CSG30 contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this a must have for any AFM laboratory. Available Options with the CSG30 AFM Mode Contact, Non Contact, Semi Contact Probe: -PtIr…
HA_NC Etalon AFM Mode Contact Probe from K-TEK NanoK-TEK Nanotechnolgy's dual cantilever Etalon probe features: • High aspect ratio tip • Precisely specified resonant frequency • Enhanced reflection • Economic price Main characteristics of the HA_NC Etalon AFM Mode Contact Probe: • Standard chip size: 1.6x3.6x0.45 mm. • High reflective Au coating. • Typical curvature radius of a tip: 10 nm. • Total tip height : 9 - 16 µm. •…
K-TEK DCP11 Diamond Coated Probe - AFM Speciality Probe Ideal for AFM oxidation nanolithography, these conductive diamond coated probes offer a robust tip that will provide its user with the longevity and consistency needed.
K-TEK Nano DCP20 Probe- Speciality AFM Diamond Coated Probe The Diamond Coated AFM Probe is ideal for AFM oxidation nanolithography, these conductive diamond coated probes offer a robust tip that will provide its user with the longevity and consistency needed.
CSC05 AFM Mode Contact Probe The K-TEK CSC05 “Whisker Type” AFM probe is specially designed to study deep holes, trenches, and narrow gap. With the addition of a small “whisker” at the tip of the probe, users are able to investigate rather complicated surfaces with relative ease.
K-TEK Nano NSG01 DLC - AFM Non-Contact Diamond-Like Carbon (DLC) Probe Super sharp diamond-like carbon (DLC) tips with typical curvature radius of 1nm are extremely useful for obtaining high resolution on objects with sizes of several nanometers. DLC tips provide users with a durable, long lasting product. To guarantee 20nm working length of DLC tips TEM is used. 10% from total number of probes in the batch are selected for…
K-TEK NSG10 - Diamond Like Carbon DLC AFM Non Contact Probes Super sharp NSG10 diamond-like carbon(DLC) AFM tips with typical curvature radius of 1nm are extremely useful for obtaining high resolution on objects with sizes of several nanometers. DLC AFM tips provide users with a durable, long lasting product. NSG10 DLC AFM tip specification: Material – diamond-like carbon Curvature radius - 1-3nm. Working length - >20nm Probe…
K-TEK Nano Grating set TGS1 consists of 3 calibration gratings: TGZ1, TGZ2, TGZ3 TGZ series is intended for Z-axis calibration of scanning probe microscopes (SPM) and non-linearity measurements. Each grating offers a different step height. Now the calibration grating set TGS1 which consists of three gratings TGZ1, TGZ2, TGZ3 is available with PTB tracable certificate. Ordering grating set TGS1 with code TGS1_PTB you will get…
Grating set TGS2 consists of 6 calibration gratings: TGZ1, TGZ2, TGZ3, TGX1, TGG1, TGT1 Fields of application for the TGS2 Calibration Grating Set: - Lateral and vertical calibration - Detection of lateral non-linearity - Detection of hysteresis, creep, and cross-coupling effects - Detection of angular distortion - 3-D visualization of the scanning tip - Determination of tip sharpness parameters (aspect ratio and curvature rad…
Grating set K-TEK Nano TGSFull consists of 8 calibration gratings: TGZ1, TGZ2, TGZ3, TGX1, TGG1, TGT1, TGQ1, TDG1 Fields of application for the TGSFull Calibration Grating Set: - SPM simultaneous calibration of X, Y, and Z directions - Submicron SPM calibration in X or Y direction - Lateral and vertical calibration - Detection of lateral non-linearity - Detection of hysteresis, creep, and cross-coupling effects - Detection of…
K-TEK DNA Test Sample DNA01 is Plasmid pGem7zf+ (Promega), which is linearized with the SmaI endonuclease. Linear DNA molecules (3000 b. p.) are deposited at the freshly cleaved mica. Molecules are uniformly distributed over the surface with the molecular density - 0,5-7 molec./um2. The typical DNA length is 1009 nm. Recommended humidity for obtaining a good image is 3-5%. K-TEK Nano DNA Sample is perfect for: - Beginners lear…
STEPP calibration sample from K-TEK Nano The Silicon Test Echeloned Pattern STEPP for AFM is designed on the base of silicon (111) surface with verified distribution of monoatomic steps as main calibrating inits for the complex control of AFM set up: • Height calibrating in angstrom and single nanometer intervals on the monoatomic steps; • Using the as the substrate for investigations of bio-objects, particulate matter and ot…
K-TEK Nano HOPG Highly oriented pyrolitic graphite (HOPG) allows users to obtain: - Critical Z resolution - Atomic resolution - Atomic smooth surface for placement of objects - Conductive samples for STM HOPG piece has a top working layer with mosaic spread 0.4 - 0.7 degree and a base layer (about 1mm) with not specified mosaic spread quality. To mark the non-working HOPG piece side the one-side scotch is used. Available HO…
HOPG from K-TEK NanotechnologyHighly oriented pyrolitic graphite (HOPG) allows users to obtain: - Critical Z resolution - Atomic resolution - Atomic smooth surface for placement of objects - Conductive samples for STM HOPG piece has a top working layer with mosaic spread 0.4 - 0.7 degree and a base layer (about 1mm) with not specified mosaic spread quality. To mark the non-working HOPG piece side the one-side scotch is used.
HOPG from K-TEK NanotechnologyHighly oriented pyrolitic graphite (HOPG) allows users to obtain: - Critical Z resolution - Atomic resolution - Atomic smooth surface for placement of objects - Conductive samples for STM
HOPG from K-TEK NanotechnologyHighly oriented pyrolitic graphite (HOPG) allows users to obtain: - Critical Z resolution - Atomic resolution - Atomic smooth surface for placement of objects - Conductive samples for STM
HOPG from K-TEK Nanotechnology -HOPG ZYH Quality - Mosaic Spread: 3.5 - 5 degreesHighly oriented pyrolitic graphite (HOPG) allows users to obtain: - Critical Z resolution - Atomic resolution - Atomic smooth surface for placement of objects - Conductive samples for STM
TETRA 14 AFM Mode: Non Contact, Semi Contact Probe from K-TEK Nanotechnology The TETRA 14 non-contact AFM probe design allows for the optical viewing of the tip as it engages the samples surface, providing its user with superior targeting ability. Combined with its tetrahedral tip, standard Au backside and high aspect ratio, the TETRA series is extremely versatile. Accompanied by its bargain pricing and complementary Au tip c…
TETRA 15 AFM Mode: Non Contact, Semi Contact Probe from K-TEK Nanotechnology The TETRA 15 non-contact AFM probe design allows for the optical viewing of the tip as it engages the samples surface, providing its user with superior targeting ability. Combined with its tetrahedral tip, standard Au backside and high aspect ratio, the TETRA series is extremely versatile. Accompanied by its bargain pricing and complementary Au tip…
TETRA 16 AFM Mode: Non Contact, Semi Contact Probe from K-TEK Nanotechnology The TETRA 16 non-contact probe design allows for the optical viewing of the tip as it engages the samples surface, providing its user with superior targeting ability. Combined with its tetrahedral tip, standard Au backside and high aspect ratio, the TETRA series is extremely versatile. Accompanied by its bargain pricing and complementary Au tip coati…
TETRA 17 AFM Mode: Contact Probe from K-TEK Nanotechnology The TETRA 17 contact AFM probe design allows for the optical viewing of the tip as it engages the samples surface, providing its user with superior targeting ability. Combined with its tetrahedral tip, standard Au backside and high aspect ratio, the TETRA series is unmatched in its versatility. Accompanied by its bargain pricing and complementary Au tip coating, the T…
TETRA 18 AFM Mode: Non Contact, Semi Contact Probe from K-TEK Nanotechnology The TETRA 18 non-contact AFM probe design allows for the optical viewing of the tip as it engages the samples surface, providing its user with superior targeting ability. Combined with its tetrahedral tip, standard Au backside and high aspect ratio, the TETRA series is extremely versatile. Accompanied by its bargain pricing and complementary Au tip…
Asylum Research MFP-3D-CF™ - Integrated Confocal / Atomic Force Microscopy System MFP-3D-CF - Advance your bioscience research by combining the power of confocal imaging with the high resolution of Atomic Force Microscopy (AFM). For years, biologists have turned to laser scanning confocal microscopy for 3D functional imaging within thick samples such as cells or tissues. AFM also uses a scanning process to form an image, but i…
