Materials Products & Reviews

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Materials analysis examines the properties, composition, and behavior of materials at a microscopic and macroscopic level. Using advanced techniques such as microscopy, spectroscopy, and chromatography, materials analysts investigate the structure, purity, and performance of various substances. From industrial materials and nanomaterials to battery testing and beyond, this field provides critical insights into the characteristics and applications of materials across industries such as manufacturing, electronics, and healthcare. Explore how materials analysis drives innovation, quality assurance, and product development for a wide range of applications.

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HT7700 120 kV Automated TEM

Hitachi High Technologies America, Inc.

Hitachi offers the sleek HT7700 for maximum performance and productivity. The radical design incorporates the ergonomics and user friendliness of a SEM with advanced automation, resolution and analytical capabilities of a TEM. Imaging is completely digital – you won’t find a viewing or projector chamber - and Hitachi’s EMIP-SP database software automatically catalogues your single frame and montaged images. The turbopump evacu…

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HD-2700 Cs Corrected STEM

Hitachi High Technologies America, Inc.

The HD-2700 is the top-of-the-range STEM featuring optional spherical aberration correction developed in collaboration with CEOS GmbH ot offer significantly improved resolution and analytical sensitivity. By correcting the spherical aberration resolution of less than 0.1 nm can be achieved in dark-field STEM mode. The Cs corrector is field retrofittable for any HD-2700 system that was originally ordered without the Cs correcto…

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HF-3300 300 kV FE TEM

Hitachi High Technologies America, Inc.

The HF-3300 300 kV FE TEM is a powerful analytical and high resolution TEM/STEM with inherent high beam brightness, high coherence, high energy resolution, and Hitachi unique functions! Features • High energy-resolution and high beam current • Parallel nanobeam electron diffraction for high precision stress analysis • Spatially-resolved EELS for instant multipoint compositional and chemical binding state analyses • Double-bipr…

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NB5000 nanoDUE'T FIB-SEM

Hitachi High Technologies America, Inc.

The Hitachi NB5000 FIB-SEM integrates a superior 40kV Ga ion FIB column with an ultra-high-resolution Schottky FE-SEM. Like all our products, all components have been designed with consideration of the total system performance. This results in exceptional stability, milling performance and resolution, allowing e.g. automated mill-and-monitor operations for 3D reconstructions with slicing steps down to 5nm. NB5000 incorporate…

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IM4000 Ion Milling System

Hitachi High Technologies America, Inc.

The Hitachi IM4000 Ar Ion Milling System offers two milling configurations available in a single instrument: cross section cutting and wide-area sample surface fine polishing. The new Ar ion gun design, with increased milling rate (300µm/h for Si), affords reduced cross section processing times by as much as 65%. For added convenience, the IM4000 sample stage unit can be removed for specimen setting and cross section edge fine…

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ZONE Desktop Sample Cleaner and Desiccator for SEM/TEM

Hitachi High Technologies America, Inc.

Sample surfaces are inevitably coated with hydrocarbon contamination due to sample preparation or from storage. The ZONE desktop sample cleaner/desiccator gently removes contaminations to reveal the true surface of your specimens. There are Two Models ZoneSEM ZoneSEM's sample holder stage was designed for Hitachi Type I and Type II carriers. Adjustable height and optional holders available. Provides effective cleaning of surfa…

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SU9000 UHR FE-SEM

Hitachi High Technologies America, Inc.

The SU9000 Ultra High Resolution FE-SEM is Hitachi's new premium UHR FE-SEM. It features unique electron optics, with the sample positioned inside a gap of the split objective lens pole piece. This so-called true inlens concept - combined with the next generation of HITACHI's cold field emission technology - guarantees the highest possible imaging resolution (0.4nm @ 30kV, 1.2nm @ 1kV) and stability. To make this resolving pow…

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Hitachi F-7000 Research Fluorescence Spectrophotometer

Hitachi High Technologies America, Inc.

The Hitachi F-7000 Fluorescence Spectrophotometer offer superior performance, functionality, and reliability. Designed to conserve benchspace (620 mm W x 520 mm D x 300 H mm), the F-7000's Ultra-High Wavelength accuracy: (S/N:800) and High-Speed Scanning (60,000 nm/min) provide unparalleled performance. • Bandpass: 1, 2.5, 5.0, 10, 20nm (EX and EM) • Wavelength Scan Speed: 30, 60, 240, 1200, 2400, 12000, 30000 and 60000nm/min…

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Hitachi VP-SEM SU1510

Hitachi High Technologies America, Inc.

Hitachi VP-SEM SU1510 - Top performance in very compact size The new Hitachi SU1510 VP-SEM combines the high-performance electron optics of the S-3400N and S-3700N with an ultra-compact design. Its main body is only 55cm wide, and unlike conventional SEM design concepts the SU1510 does not require a special display and operating console - instead, monitor and PC controls can be conveniently placed on any user prepared workspac…

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Monolith X for Immobilization-Free Binding Affinity Measurements

NanoTemper Technologies

Monolith X is a capillary-based system that enables you to measure the strength of molecular interactions in solution, without the need for immobilization. Minimal impact fluorescent labelling empowers you to measure Kds between a wide variety of targets and ligands using low amounts of sample. Enjoy approachable assay development with a fully guided process embedded in the default software.  

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FlowCam Macro

Yokogawa Fluid Imaging Technologies, Inc

Extend your particle imaging capabilities from 300 μm to 5 mm with FlowCam Macro for aquatic and environmental research and materials characterization. Obtain detailed morphological data along with accurate counting and sizing measurements to enable differentiation of diverse zooplankton species and particle types.

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FlowCam LO

Yokogawa Fluid Imaging Technologies, Inc

Innovative particle characterization with FlowCam® LO combines flow imaging microscopy (FIM) and light obscuration (LO) into a single analytical solution. Beyond the compendial light obscuration method to fulfill USP <787> and <788> requirements, flow imaging microscopy provides an orthogonal method for quality control of subvisible particulate matter.

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Solentim Cell Metric X

Advanced Instruments

Cell Metric set the standard for high-contrast imaging. Cell Metric X raises the bar, saving the time taken for clonal verification on day 0 via the use of artificial intelligence-based Automated Evidence of Clonality.  Accelerate your path to IND submission—with zero compromises in quality. For unrivaled clonality assurance and high-contrast imaging, make the trusted standard your standard.

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  • Best New Drug Discovery Product of the Year
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Cannabis Testing

Merck

Discover our efficient product solutions for effective cannabis quality testing. From sample homogenization and preparation, to standardization and characterization, we have got advanced products covering the cannabis testing workflow.

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