Thermo Scientific™ Themis™ ETEM
Thermo Fisher ScientificAtomic resolution TEM for materials structure analysis with an environmental mode for in situ TEM studies.
Electron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.
Atomic resolution TEM for materials structure analysis with an environmental mode for in situ TEM studies.
Precise SEM characterization of nanomaterials with sub-nanometer resolution and high material contrast.
3D SEM for large volume samples with serial block face imaging and multi energy deconvolution.
108 Auto Sputter Coater - ideal for routine sample preparation for scanning electron microscopy The Ted Pella 108 Auto Sputter Coater is ideally suited for automated high quality coating of non-conducting samples for standard SEM imaging. The added functionality of the automatic features enable fine grain coating on a range of samples with a choice of target materials. The automatic purge and leak functions together with the o…