Characterization of Solid Oxide Electrolysis Cells by Advanced Focused Ion Beam-SEM Tomography

This white paper investigates the microstructural changes after cycling of a solid oxide electrolysis cell (SOEC), studied by means of focused ion beam (FIB)-SEM tomography. The advanced tomography package, ZEISS Atlas 5 3D Tomography, enables high-resolution 3D electron imaging and 3D energy dispersive X-ray spectroscopy (EDS) elemental imaging, using two different sets of SEM conditions optimized for the respective task.