Explore the Dimension Edge with ScanAsyst

In this application note, explore the Dimension Edge™ Atomic Force Microscope (AFM) which incorporates Bruker’s PeakForce Tapping^® technology to provide the high levels of performance, functionality, and accessibility. Based on the Dimension Icon^® platform, the Edge system has been designed from top to bottom to deliver the low drift and low noise necessary to achieve publication-ready data in minutes instead of hours, all at price points well below expectations for such performance. Furthermore, explore how ScanAsyst^® imaging, integrated visual feedback, and preconfigured settings enable expert-level results simply and consistently.