Dimension Edge™ AFM platform
Atomic Force Microscopy for Patterned Sapphire Substrates Delivering advanced automated metrology and production capabilities with superior resolution for now and the future. Bruker's Dimension Edge™ PSS Atomic Force Microscope with AutoMET™ Metrology Analysis Software is the ideal nano-metrology and nano-inspection system for LED substrate and epitaxial manufacturers. As an extension of the Dimension Edge AFM platform, the Ed…
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Reliable results, smart scanayst mode for scanning
Surface modification
This AFM is highly automated and reliable for a lot of surface analysis. We use it mostly for the roughness measurement. However, it did require a flat surface in order to have a relatively good image.
Review Date: 25 Feb 2016 | Bruker Nano Surfaces and Metrology
Atomic Force Microscopy for Patterned Sapphire Substrates
Delivering advanced automated metrology and production capabilities with superior resolution for now and the future.
Bruker's Dimension Edge™ PSS Atomic Force Microscope with AutoMET™ Metrology Analysis Software is the ideal nano-metrology and nano-inspection system for LED substrate and epitaxial manufacturers. As an extension of the Dimension Edge AFM platform, the Edge PSS incorporates the incredible value and resolution for which the Dimension AFM systems are renowned, while also providing a specialized solution for substrate measurements.
The system incorporates Bruker's proprietary AutoMET metrology analysis software, which has been designed specifically to meet the needs of patterned sapphire substrate (PSS) suppliers, providing a level of automation and ease of use never before seen in a value-price atomic force microscope.
