Improving the accuracy of nanomechanical measurements with force-curve-based AFM techniques

The structure and mechanical properties of sub-micron features in materials are of particular interest due to their influence on macroscopic material performance and function. Atomic force microscopy has the high resolution and force control to directly probe the mechanical properties of a wide range of these materials. In this application note from Bruker, consider the development and implementation of several new features that improve the flexibility, accuracy, and productivity of atomic force microscopes in measuring such important material properties as modulus and adhesion.