Nanoscale mapping of permittivity and conductivity with scanning microwave impedance microscopy

Scanning microwave impedance microscopy (sMIM) is an atomic force microscopy (AFM)-based technique for materials and device characterization. The reflected microwave signal from the tip-sample interface holds information of the electrodynamic properties of the sample surface underneath the tip apex. In this application note from Bruker, explore sMIM and its integration with Bruker’s versatile AFM platforms, such as the Dimension Icon® and Dimension Edge™ AFMs. Furthermore, discover how when combined with Bruker’s exclusive PeakForce Tapping® mode, it is possible to obtain sMIM results on delicate samples, such as carbon nanotubes.