Product NewsAdvances to the Scanning Electron Microscope ZEISS EVO Presented at Microscopy and Microanalysis 2013 Meeting
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Product NewsBruker Elemental Introduces Integrated Camera and Small Spot Collimator Options for S1 TITAN Handheld XRF Analyzer
Product NewsXEI Scientific Announces the M&M 2013 Launch of Zephyr™ Cleaning Technology with the Evactron® 25Z Decontaminator
Product NewsJEOL Demonstrates New JEM-1400Plus 120kV Transmission Electron Microscope for High Contrast, CryoTEM, and S/TEM Applications
Industry NewsAgilent Technologies Awards Russell Varian Prize for Innovation in NMR to Dr. Lucio Frydman
Product NewsFEI Introduces Three New Transmission Electron Microscopy Systems for Semiconductor and Scientific Research
Product NewsJPK Reports on the Developments of High Resolution Imaging at Kanazawa University in Japan
Product NewsThermo Fisher Scientific Releases OXSAS 2.0 Analytical Software Integrating UniQuant Standardless Program
Industry NewsMerck’s Innovative isishape® Etching Pastes Win Two Global Awards for Quality and Service
Product NewsDataApex Announces New Clarity 5.0 Multilingual Chromatography Software with MS Capabilities
Product NewsSUNY Binghamton Applies Linkam Temperature Stage Microscopy to the Understanding of Electronic Packaging & Reliability
Product NewsAndor’s sCMOS Cameras Exhibit 100 fps in µManager Open Source Microscopy Acquisition Software
Product NewsMalvern Instruments Adds Fiber Analysis Capabilities in New Software for Morphologi G3 System
