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EPMA-8050G Electron Probe Microanalyzer

This instrument is equipped with a cutting-edge FE electron optical system, which provides unprecedented spatial resolution under all beam current conditions, from SEM observation conditions up to 1 μA order. Integration with high performance X-ray spectrometers that Shimadzu has fostered through the company's traditions achieves the ultimate advance in analysis performance.

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This instrument is equipped with a cutting-edge FE electron optical system, which provides unprecedented spatial resolution under all beam current conditions, from SEM observation conditions up to 1 μA order. Integration with high performance X-ray spectrometers that Shimadzu has fostered through the company's traditions achieves the ultimate advance in analysis performance.

Features:

  • Unprecedented spatial resolution
  • Large beam current enabling ultra high sensitivity analysis
  • Up to five high performance 4-inch x-ray spectrometers can be mounted
  • Simple and easy-to-understand operations for all analyses

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