Products &amp; Reviews

The most accurate and high-resolution Atomic Force Microscope for small sample research

4.7/5.0

|2 Reviews

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Park FX40 AFM

The next-generation automatic Atomic Force Microscope for academic research

4.4/5.0

|2 Reviews

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Park NX-Hivac

High vacuum Atomic Force Microscope for failure analysis applications and ?atmosphere-sensitive materials research

0.0/5.0

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Park NX7

The most affordable research grade Atomic Force Microscope with flexible sample handling

0.0/5.0

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Park NX20 300mm

The leading automated nanometrology tool for 300 mm wafer measurement and analysis

0.0/5.0

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Park NX-Wafer

NX-Wafer is the wafer fab Atomic Force Microscope with automatic defect review (ADR) that improves defect review productivity by up to 1,000%

0.0/5.0

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Park NX-3DM

Park 3DM Series is the completely automated AFM system designed for overhang profiles, high-resolution sidewall imaging, and critical angle measurements.

0.0/5.0

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Park NX20 AFM

High-Resloution Atomic Force Microscope for academic and industrial large sample research and failure analysis

0.0/5.0

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Park NX-Hybrid WLI

Atomic force microscope with built-in white light interferometry profilometry (WLI) for semiconductor and related applications

0.0/5.0

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Park NX-Mask

Park NX-Mask is the most effective, safe and efficient Photomask Repair System for High-end EUV Mask Repairs.

0.0/5.0