Materials Products & Reviews

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Materials analysis examines the properties, composition, and behavior of materials at a microscopic and macroscopic level. Using advanced techniques such as microscopy, spectroscopy, and chromatography, materials analysts investigate the structure, purity, and performance of various substances. From industrial materials and nanomaterials to battery testing and beyond, this field provides critical insights into the characteristics and applications of materials across industries such as manufacturing, electronics, and healthcare. Explore how materials analysis drives innovation, quality assurance, and product development for a wide range of applications.

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aurora Elite ICP-MS

Bruker CAM

Inductively Coupled Plasma Mass Spectrometer (ICP-MS) The Science of sensitivity Bruker's ICP-MS is famous for its innovative and unique technology and has now been further refined to meet the ever increasing demands of latest application and laboratory requirements. Bruker's aurora M90 continues to be the workhorse for the routine laboratory, now with additional and improved characteristics. In addition to the aurora M90, Bru…

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Model 3000 Annular Dark Field Detector

E.A. Fischione Instrumental Inc.

High-resolution STEM imaging The Model 3000 Annular Dark Field (ADF) Detector is ideal for high-resolution scanning transmission electron microscopy (STEM) imaging. It allows simultaneous high angle ADF imaging and electron energy less spectroscopy (EELS). It has single electron detection capabilities and high quantum efficiency. The detector is pneumatically retractable from the beam path. Atomic-resolution imaging and Z-cont…

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Model 190 Cryo-Can for SEM

E.A. Fischione Instrumental Inc.

Provides clean environment for SEM The Cryo-Can provides a clean environment for SEM sample imaging and analysis. It helps eliminate chamber contamination resulting from sample outgassing and other sources. The Cryo-Can improves both imaging and analytical data quality. It is ideal for high beam current applications. Uses SEM vacuum system The Cryo-Can vacuum container is readily connected to one of the SEM chamber ports and d…

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Model 1040 NanoMill® TEM specimen preparation system

E.A. Fischione Instrumental Inc.

Revolutionary ultra-low-energy, concentrated ion beam Fischione’s Model 1040 NanoMill® TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens needed for advanced transmission electron microscopy (TEM) imaging and analysis. It is ideal for both post-FIB (focused ion beam) processing and the enhancement of conventionally prepared specimens. Targeted, ultra-low-energy NanoMillingsm proce…

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Automatic Twin-Jet Electropolisher

E.A. Fischione Instrumental Inc.

High-quality thin foils for TEM Electrolytic thinning of conductive materials is an effective method of quickly producing specimens for transmission electron microscopy (TEM) without any induced artifacts. In the Model 110 Twin-Jet Electropolisher, twin jets simultaneously polish both sides of the sample, creating electron transparent specimens within a few minutes. The Electropolisher features easily adjustable electrolyte fl…

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Disposable Cuvettes for Spectroscopy

Kartell S.p.A.

Disposable cuvettes for spectrophotometry, optical PS visible range cuvettes, UV Grade PMMA cuvettes. Standard and semi-micro disposable cuvettes for spectroscopy made of optical PS and PMMA UV grade optical windows to achieve optimal transmittance through spectral range from 340 to 800 nm (OPS) an from 280 to 800 nm (PMMA UV qrade). The engineering and quality control determine the reproducibility of the cuvettes. These are s…

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PELCO® STEM Imaging Holder

Ted Pella Inc.

The PELCO® STEM imaging holder enables STEM imaging in the SEM by using the standard Everhart-Thornley SE detector in the SEM chamber. The standard 3mm TEM grid is placed in the grid holder and located under the scanning beam. The STEM image is created by the adjustable Pt conversion plate which must face the chamber SE-detector. Cost-effective method for STEM imaging by using the existing SE detector in the SEM chamber. The i…

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EBSD QuasOr

Thermo Fisher Scientific

Thermo Scientific QuasOr, the no compromise EBSD. Electron Backscatter Diffraction (EBSD) enables nanostructural analysis in the electron microscope by characterizing the crystalline structures which affect physical properties in a wide range of materials. As an integral part of the Thermo Scientific NORAN System 7, simultaneous acquisition of EBSD and EDS/WDS spectral images are performed with ease.

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MicroXCT-200

Xradia

MicroXCT-200 - High Resolution and Contrast; Large Sample Size and Shape Flexibility; Automated Multiple Point Imaging. The MicroXCT-200 is a versatile 3D X-ray imaging system suited for non-destructive analysis of a large variety of samples. Its unique design allows for high resolution imaging for relatively large samples. Its detectors are tailored to image both high and low absorption materials. The MicroXCT-200 provides t…

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UltraXRM-L200

Xradia

UltraXRM-L200 - Synchrotron-like 3D Imaging in a Laboratory System. The UltraXRM-L200 is the only lab based ultra-high resolution CT scanner for 3D visualization of microscopic sample volumes. Xradia's precision X-ray focusing optics deliver a resolution as fine as 50 nm, seamlessly extending the capabilities of X-ray CT beyond those of conventional scanners. Integrated Zernike phase contrast imaging enhances the visibility o…

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PIONA+™ Analyzer

Bruker CAM

Bruker’s innovative PIONA+™ Analyzer, based on the powerful 450-GC gas chromatograph, provides a highly flexible platform to obtain comprehensive characterization and quantitative information, including hydrocarbon group types, aromatics and oxygenates per carbon number for spark emission fuels. The system comes complete with ultra high performance columns and traps, CompassCDS™ chromatography data handling software and PIONA+…

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Optical Dilatometer (Horizontal)

Expert System Solutions S.r.l.

The Horizontal Optical Dilatometer Misura® ODLT is the ideal instrument to study the coefficient of thermal expansion (CTE), testing materials beyond the softening point and reproducing industrial firing cycles. It allows to carry out thermo-mechanical measurements even beyond the softening point of a material throughout the entire industrial firing cycles (up to 1750°C on sample). Also, it can determine an expansion and shrin…

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Optical Dilatometer (Vertical)

Expert System Solutions S.r.l.

The Vertical Optical Dilatometer Misura® ODHT is the ideal instrument to study sintering, sintering kinetics, expansion and shrinkage. It allows to carry out thermo mechanical measurements following the process of expansion, sintering or bloating of materials. The practical applications of this technique are various and include all fields in which it is important to know the thermo-mechanical behaviour of the materials, reprod…

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Heating Microscope

Expert System Solutions S.r.l.

The Heating Microscope is able to acquire and store images of a specimen subjected to an industrial heating cycle ,while all the dimensional parameters (height, length, area…,etc.) are measured automatically during the test in order to identify: flattening/melting behaviour, fusibility, identification of the characteristic temperatures Misura® Heating Microscopes have been continuously developed and implemented to gain technic…

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Optical Fleximeter

Expert System Solutions S.r.l.

The Optical Fleximeter Misura® FLEX is the ideal instrument to study flexural behaviour of materials undergoing real industrial firing cycles without application of loads. The Optical Fleximeter Misura® FLEX is the ideal instrument to identify the coupling temperature, qualitative studies of the residual stresses between coupled materials and the pyroplastic deformations, which are related to the tendency of a material to defo…

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Heating Microscope and Vertical Optical Dilatometer

Expert System Solutions S.r.l.

The Heating Microscope and Vertical Optical Dilatometer Misura® HSM-ODHT is ideal for studying the flattening/ melting and sintering behaviour of materials undergoing real industrial firing cycles. The combination of the Heating Microscope with the Optical Dilatometer allows a better control of industrial processes, quality control of materials and development of new products with specific properties.

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Heating Microscope and Horizontal Optical Dilatometer

Expert System Solutions S.r.l.

The Heating Microscope and Horizontal Optical Dilatometer Misura® HSML-ODLT is ideal for studying the melting/ flattening behaviour and coefficient of thermal expansion of materials. It is the ideal instrument for all the materials which present reduced or considerable expansions and contractions and it is incomparable for the study of thin materials without thickness limitations.

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Heating Microscope and Optical Fleximeter

Expert System Solutions S.r.l.

The Heating Microscope and Optical Fleximeter Misura® HSML-FLEX is ideal for studying the melting/ flattening and flexural behaviour of materials. Through this instrument it is possible to study the physical behaviour of materials during industrial firing cycles and to carry out no contact bending measurements, which enables to have a more complete characterization of the evaluated materials.

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Heating Microscope, Optical Fleximeter and Horizontal Optical Dilatometer

Expert System Solutions S.r.l.

The Heating Microscope, Optical Fleximeter and Horizontal Optical Dilatometer Misura® HSML-FLEX-ODLT is an incomparable combination of three instruments ideal for studying the melting/ flattening, dilatometric and flexural behaviour of materials undergoing real industrial firing cycles. It represents a valid solution to study the physical behaviour of materials during a firing treatment, to carry out no contact bending dilatom…

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QExtra: Quantum Efficiency Enhancing CCD Technology

HORIBA Scientific

HORIBA Scientific introduces QExtraTechnology, an anti-reflective multi-layer coating to significantly improve quantum efficiency over a broad spectral range while suppressing undesirable etaloning effects.QExtraTechnology provides outstanding quantum efficiency for experiments which require coverage from UV to NIR while suppressing etaloning effects noticeable at longer wavelengths in basic back-illuminated deep depleted came…

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