Electron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.
The Thermo Scientific Tundra™ Cryo-Transmission Electron Microscope (Cryo-TEM) is a dedicated structure-determination solution designed to bring single particle analysis to every biochemistry laboratory. It is easier to use than typical cryo-TEM instruments, fits into a standard lab space, and matches grant mechanisms and funding opportunities globally. The Tundra™ Cryo-TEM is a powerful tool that can help answer your most ch…
The JEOL JEM-1400 series 120kV Transmission Electron Microscope is widely accepted for its ease of use and high resolution imaging and analysis. Applications include pathology, biology, quality control, nanotechnology, polymer, and materials development.
The Thermo Scientific™ Apreo™ 2 SEM expands access to high-performance imaging and analytics to all levels of microscopy expertise.
Thermo Scientific™ Helios™ G4 PFIB delivers unmatched capabilities for large volume 3D characterization, Ga+free sample preparation and precise micromachining.
The Thermo Scientific™ Helios 5 Hydra UX DualBeam is part of the fifth generation of the industry-leading Helios DualBeam family.
Thermo Scientific™ HeliScan™ brings a new era of microCT to Materials Science by leveraging advanced helical scanning and iterative reconstruction technology to produce unsurpassed image fidelity.
Desktop SEM enabling high quality steel manufacturing through failure analysis and process improvement.
Desktop SEM for additive manufacturing analysis, capable of observing large samples up to 100 mm x 100 mm.
Component cleanliness analysis with a multi-purpose desktop SEM.
SEM EDX gunshot residue analysis (GSR analysis) with desktop SEM.
