Scanning Electron Microscopes (SEM) Products & Reviews

Scanning Electron Microscopes (SEM)

Product Filter

Explore by Field
Electron Microscopy
Scanning Electron Microscopes (SEM)
Explore by Company

Ratings

Search

MIRA FEG-SEM Series

Tescan

This new generation of MIRA field emission scanning electron microscopes provides users with the advantages of the latest technology, such as new improved high-performance electronics for faster image acquisition, an ultra-fast scanning system with compensation for static and dynamic image aberrations or built-in scripting for user-defined applications, all the while maintaining the best price to performance ratio. The MIRA…

4.4/5.0
|4 Reviews



MSP-1S

Shinkuu

This device is dedicated to precious metal thin film coating for SEM observation.

4.0/5.0
|1 Review