Scanning Electron Microscopes (SEM) Products & Reviews

For the Highest Demands in Imaging and Analytics from Any Sample

RISE Microscopy is a novel correlative microscopy technique that combines SEM and confocal Raman Imaging and links ultra-structural surface properties to molecular compound information. RISE Microscopy combines an SEM and a confocal Raman microscope. The confocal Raman microscope is integrated into the vacuum chamber of the electron microscope. Non-destructive Raman and SEM measurements are consecutively performed at two diff…

The S-3400N is the World Class Variable Pressure SEM The S-3400N offers advances in automation including full filament saturation and “no touch” objective aperture alignment. The New Analytical Chamber Provides • Segment, Ultra Thin, Backscattered Electron Detector Capable of TV Rate Observation • Fully Automated with One Button Automatic "No Touch" Objective Aperture Alignment • Turbo Molecular Pump (TMP) Provides a Fast and…

The SU3500 Scanning Electron Microscope features innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance. Designed with intuitive logic, the new user-friendly GUI provides comprehensive image observation and display functions. Engineered for a wide range of applications, including biological specimens and advanced materials, the SU3500 is sure to be the workhorse micros…

The SU8000 Series is Hitachi's latest product family of ultra-high performance, semi-in-lens SEM with cold-field emission. The series was developed in response to the growing demand for robust, affordable SEM application solutions. Image performance in this series is optimized with the latest generation of Hitachi's patented super ExB in-lens detection for energy filtering, charge suppression, and contrast control; affording u…

Ultra-high Resolution Scanning Electron Microscope SU8200 Series - Innovative Cold Field Emission Gun with Unmatched Resolution and Beam Stability This novel CFE gun employs a Hitachi patented "Mild flashing" technique and a new vacuum system which greatly minimizes gas molecule deposition on the emitter tip. The emitter always operates in a "clean" state, and emission current and beam stability are significantly improved. The…

The TM3030/TM3030Plus are equipped with premium signal detectors which have been incorporated in FE-SEM and VP-SEM and provide unparalleled image quality.  

Extending the capabilities of the successful S-900 and S-5000 family of in-lense SEMs, the Hitachi S-5500 cold field emission scanning electron microscope sets a new standard for ultra-high resolution SEMs designed for today's nano- technology research and development. The S-5500 is unique in that it allows simultaneous secondary electron and backscattered electron imaging using an integrated detector design. The S-5500 permit…

A fully PC controlled SEM with conventional tungsten heated cathode intended both for high vacuum as well as for low vacuum operations. Outstanding optical properties, flicker-free digital image with super clarity, sophisticated user-friendly software for microscope control and image capturing using Windows™ platform, standard formats of stored images, easy image management, processing and measurements, automatic setup of the…

MIRA3 AMU is a high performance FE-SEM system equipped with an extraordinarily large chamber. This unique microscope allows the imaging and analysis of extraordinary large samples that cannot be fitted in standard chambers.