X-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.
VersaXRM-500 - Industry's largest working distance at highest resolution. The Xradia VersaXRM™ family is the latest generation of 3D X-ray microscopy (XRM) solutions optimized for non-destructive micro tomography. The VersaXRM-500 advances industry and science with a versatile combination of world-leading resolution and contrast, sample flexibility and the large working distance required to address emerging research challen…
UltraXRM-S200/220 - Energy-tunable, Ultra-high Resolution 3D X-ray Microscopy For Synchrotron Facilities.The UltraXRM-S series harnesses the powerful X-ray beams produced by synchrotron radiation facilities for ultra-high resolution 3D X-ray microscopy. Combined with the superior X-ray imaging technology developed for the laboratory-based UltraXRM-L, the UltraXRM-S series is capable of producing 3D images with 30 nm resolution…
UltraSPX-200/220 - Ultra-high Resolution Analytical Scanning-Probe X-ray Microscope for Synchrotron Facilities. The UltraSPX-S series takes advantage of the coherent X-ray beams available at modern synchrotron light sources to bring established X-ray analytical techniques, such as X-ray fluorescence, spectroscopy, and diffraction down to the nanometer scale. Xradia's high-performance proprietary X-ray optics employed in the U…
Designed for ultra-low level sulfur analysis of diesel, petrol (gasoline) and other fuels, the Rigaku Micro-Z ULS wavelength dispersive X-ray fluorescence (WDXRF) instrument features a novel design that measures both the sulfur peak and the back-ground intensity. The ability to measure and correct for changes in background intensity delivers a better net peak intensity measurement, resulting in superior calibrations and enhan…
Thermo Scientific* OXSAS X-Ray Fluorescence Analysis Software performs rapid, high-quality analyses using template-driven operations. Thermo Scientific OXSAS is software for WDXRF spectrometers in the ARL PERFORM'X* Series, ARL OPTIM'X Series and ARL 9900 IntelliPower* Series. This platform evolves to meet changing needs with up-to-date solutions throughout instrument lifetime. OXSAS* X-Ray Fluorescence Analysis Software Fea…
Xradia 810 Ultra increases the throughput of nanoscale, three-dimensional X-ray imaging by up to a factor of 10. This innovative X-ray microscope (XRM) operates at 5.4 keV, a lower energy that delivers better contrast and image quality for medium to low Z samples and other materials used throughout science and industry. Better contrast enables higher-quality tomographies to be acquired an order of magnitude faster while achie…
Rigaku's WaferX 310 represents the culmination of 35 years of experience in the X-ray fluorescence analysis of thin films on silicon wafers. The WaferX 310 is ideal for measuring BPSG, PSG and metal films. In addition, thin film BPSG, multilayered circuit film, WSix, electrode films, ferrodielectric thin films, FRAM, next generation DRAM, and SiOF are standard applications for this tool.Highly accurate analyses for the ultral…
The Rigaku MFM310 performs high-precision measurements not possible by optical or ultrasonic techniques. Perform thickness, density, roughness & composition of films on blanket and patterned wafers. This sophisticated X-ray metrology tool makes it practical to perform high-throughput measurements on product and blanket wafers ranging from ultrathin single-layer films to multilayer stacks.The MFM310 is designed with high-volum…
Rigaku's unique AZX 400 sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer was specifically designed to handle very large and/or heavy samples. Accepting samples up to 400 mm diameter, 50 mm thick and 30 kg weight, this system is ideal for analyzing sputtering targets, magnetic disks, or for multilayer film metrology or elemental analysis of large samples.Having the versatility to adapt to your specific…
On-line analysis with our S2 KODIAK - Meet the future of process control. Achieve the next level of efficiency in mining and mineral beneficiation with S2 KODIAK! Real-time process control in the mine is vital in order to achieve optimal cost efficiency. At the same time, it is challenging to bring an analytical instrument into the process. The S2 KODIAK on-line XRF works autonomous and maintenance-free 24/7.It delivers immed…
Rigaku nano3DX is a true X-ray microscope (XRM) with the ability to measure relatively large samples at high resolution. This is accomplished by using a high powered rotating anode X-ray source and a high-resolution CCD imager. The rotating anode provides for fast data acquisition and the ability to switch anode materials easily to optimize the data acquisition. AVAILABILITY: Japan, Austraila/NZ and North AmericaThe new nano3…
Rigaku’s HyPix-3000 is a next-generation two-dimensional semiconductor detector designed specifically to meet the needs of the home lab diffractionist. One of the HyPix-3000’s unique features is its large active area of approximately 3000 mm² with a small pixel size of 100 μm², resulting in a detector with high spatial resolution. In addition, the HyPix-3000 is a single photon counting X-ray detector with a high count rate of…
SPECTROSCOUT – The portable spectrometer that brings lab-grade analysis into the field. The new portable spectrometer, SPECTROSCOUT, is an energy-dispersive X-Ray Fluorescence (ED-XRF) analyzer that incorporates much of the analytical power of top-grade laboratory benchtop analyzers like SPECTRO XEPOS. Incredibly, SPECTROSCOUT is such a portable spectrometer that it approaches the easy portability of the handheld XRF, SPECTRO…
Meet a broad range of food safety and quality requirements with the Thermo Scientific™ NextGuard™ X-ray Detection System. An affordable foreign object detection system for a wide variety of food applications, the NextGuard X-ray Detection System is now designed with enhanced capabilities to inspect packaged products for missing pieces or components, under and over-fills, and contaminants using new, easily customizable vision…
High performance benchtop EDXRF spectrometer with Windows® software.
High performance WDXRF for rapid quantitative elemental analysis
Precise, high-speed elemental analysis for process control in metal production
Rigaku NEX DE VS High-performance, Direct Excitation Variable Spot EDXRF Elemental Analyzer
