X-Ray Diffraction and Spectroscopy Products & Reviews

25

X-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.

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ZEISS ART

ZEISS Research Microscopy Solutions

Advanced Reconstruction Toolbox (ART) is a collection of state-of-the-art reconstruction technologies for ZEISS X-ray microscopes or microCTs. ART leverages AI and a deep understanding of both X-ray physics and customer applications to solve some of the hardest imaging challenges in new and innovative ways. These optional modules are workstation-based solutions that provide easy access and usability. 

5.0/5.0
|1 Review
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Epsilon 1 range

Malvern Panalytical

Epsilon 1 makes elemental analysis easy - a fully integrated energy dispersive XRF analyzer, built-in computer and a touch screen, offering  pre-calibrated  solutions with guaranteed performance. Epsilon 1 is fast and cost-effective, delivering precise and accurate data, ease of use, and easy sample prep, and low cost of ownership.

4.5/5.0
|9 Reviews
  • Best New Spectroscopy Product of the Year
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iKon-M USB X-Ray

Oxford Instruments Andor

Andor’s iKon-M X-Ray CCD Cameras are designed to offer high-performance solutions to your direct detection X-ray needs, and come in two variants: DO and DY. The DO variant interfaces easily with vacuum chambers, whereas the DY variant is a ‘stand-alone’ camera with beryllium input window. The systems offer very low read noise floor, high QE across the X-ray, XUV and EUV range, and boast negligible dark current with thermoelect…

5.0/5.0
|1 Review
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EDX-7000/8000/8100 Energy Dispersive X-ray Fluorescence Spectrometers

Shimadzu Corporation

Incorporating a new high-performance semiconductor detector, Shimadzu’s EDX-7000/8000 Energy Dispersive X-ray Fluorescence Spectrometers offer excellent sensitivity, resolution, and throughput for an array of applications, from general screening analysis to advanced materials research. The EDX-7000/8000 systems’ new state-of-the-art semiconductor (SDD) detector offers a high fluorescent X-ray count per unit time. This enabl…

5.0/5.0
|1 Review
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S1 TURBO SD

Bruker AXS Inc.

S1 TURBO SD Handheld XRF Spectrometer So what makes the S1 TURBO SD such an important innovation in this field? The key is the XFlash® Silicon Drift Detector, which offers count rates and resolution far superior to traditional SiPIN detector technology. This results in even faster analysis – 2-3 second grade ID’s and 5 seconds for elemental chemical analysis (excluding light elements). That’s about five times faster than previ…

5.0/5.0
|1 Review

MiniFlex Benchtop XRD

Rigaku Corporation

New 6th-generation general purpose benchtop XRD system for phase identification and phase quantification. New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research,…

4.7/5.0
|11 Reviews

ZSX Primus II

Rigaku Corporation

Rigaku ZSX Primus II delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards. ZSX Primus II features an innovative optics-above configuration. Never again worry about a contaminated beam path or down time due to sample chamber maintenance. The optics-above geometry eliminates cleaning worries and increases…

4.7/5.0
|2 Reviews