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HT7700 120 kV Automated TEM

Hitachi High Technologies America, Inc.

Hitachi offers the sleek HT7700 for maximum performance and productivity. The radical design incorporates the ergonomics and user friendliness of a SEM with advanced automation, resolution and analytical capabilities of a TEM. Imaging is completely digital – you won’t find a viewing or projector chamber - and Hitachi’s EMIP-SP database software automatically catalogues your single frame and montaged images. The turbopump evacu…

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HD-2700 Cs Corrected STEM

Hitachi High Technologies America, Inc.

The HD-2700 is the top-of-the-range STEM featuring optional spherical aberration correction developed in collaboration with CEOS GmbH ot offer significantly improved resolution and analytical sensitivity. By correcting the spherical aberration resolution of less than 0.1 nm can be achieved in dark-field STEM mode. The Cs corrector is field retrofittable for any HD-2700 system that was originally ordered without the Cs correcto…

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HF-3300 300 kV FE TEM

Hitachi High Technologies America, Inc.

The HF-3300 300 kV FE TEM is a powerful analytical and high resolution TEM/STEM with inherent high beam brightness, high coherence, high energy resolution, and Hitachi unique functions! Features • High energy-resolution and high beam current • Parallel nanobeam electron diffraction for high precision stress analysis • Spatially-resolved EELS for instant multipoint compositional and chemical binding state analyses • Double-bipr…

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NB5000 nanoDUE'T FIB-SEM

Hitachi High Technologies America, Inc.

The Hitachi NB5000 FIB-SEM integrates a superior 40kV Ga ion FIB column with an ultra-high-resolution Schottky FE-SEM. Like all our products, all components have been designed with consideration of the total system performance. This results in exceptional stability, milling performance and resolution, allowing e.g. automated mill-and-monitor operations for 3D reconstructions with slicing steps down to 5nm. NB5000 incorporate…

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IM4000 Ion Milling System

Hitachi High Technologies America, Inc.

The Hitachi IM4000 Ar Ion Milling System offers two milling configurations available in a single instrument: cross section cutting and wide-area sample surface fine polishing. The new Ar ion gun design, with increased milling rate (300µm/h for Si), affords reduced cross section processing times by as much as 65%. For added convenience, the IM4000 sample stage unit can be removed for specimen setting and cross section edge fine…

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Primaide HPLC Systems

Hitachi High Technologies America, Inc.

The Hitachi HPLC Primaide is designed for long-term, stable operation, and features both high reliability and great durability. It offers tremendous capability for everyday analysis.Based on over 50 years of experience in the development and production of HPLC systems, Hitachi proudly introduces the Primaide. Make the most of your analytical equipment with Hitachi as the “Prime Aide” in your lab! Modules • Primaide 1110 Pump w…

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ZONE Desktop Sample Cleaner and Desiccator for SEM/TEM

Hitachi High Technologies America, Inc.

Sample surfaces are inevitably coated with hydrocarbon contamination due to sample preparation or from storage. The ZONE desktop sample cleaner/desiccator gently removes contaminations to reveal the true surface of your specimens. There are Two Models ZoneSEM ZoneSEM's sample holder stage was designed for Hitachi Type I and Type II carriers. Adjustable height and optional holders available. Provides effective cleaning of surfa…

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SU9000 UHR FE-SEM

Hitachi High Technologies America, Inc.

The SU9000 Ultra High Resolution FE-SEM is Hitachi's new premium UHR FE-SEM. It features unique electron optics, with the sample positioned inside a gap of the split objective lens pole piece. This so-called true inlens concept - combined with the next generation of HITACHI's cold field emission technology - guarantees the highest possible imaging resolution (0.4nm @ 30kV, 1.2nm @ 1kV) and stability. To make this resolving pow…

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