Surface / Stylus Profilometer Products & Reviews

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Surface / Stylus Profilometer

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Dektak® 8 Advanced Development Profiler

VEECO Instruments Inc.

The Dektak® 8 Advanced Development Profiler combines high repeatability, low-force sensor technology, and advanced 3D data analysis for surface characterization of MEMS, semiconductors and other thin/thick films. The system provides 7.5 angstrom, 1 sigma step height repeatability and a vertical range of up to 1mm. Its overhead gantry design enables scan lengths to 200mm, for planarity and flatness measurements.

3.3/5.0
|1 Review

DektakXT

Bruker Nano Surfaces and Metrology

The DektakXT stylus profilometer features a revolutionary benchtop design that enables an unmatched repeatability of 4 Å and up to 40% improvement in scanning speeds. The technological breakthroughs incorporated in DektakXT enable critical nanometer-level surface measurements for the microelectronics, semiconductor, solar, high-brightness LED, medical, and materials science industries.

0.0/5.0
|0 Reviews
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