Dimension FastScan™
World's Ultimate AFM The new benchmark for speed with highest resolution and performanceThe Dimension FastScan™ delivers, for the first time, extreme imaging speed without loss of resolution, loss of...
Bruker Nano Surfaces and Metrology provides industry-leading surface and dimensional analysis tools, including AFMs, tribometers and mechanical testers, nanomechanical and nanotribological test instruments, and AFM-IR (nanoIR) technology. Whatever you material or scale of investigation, our broad range of surface analysis instruments can be used to provide solutions for R&D, QA/QC, and failure analysis with speed, accuracy, and ease. Visit www.bruker.com/nano for more information.
World's Ultimate AFM The new benchmark for speed with highest resolution and performanceThe Dimension FastScan™ delivers, for the first time, extreme imaging speed without loss of resolution, loss of...
The nanoIR3 is the latest generation nanoscale IR spectroscopy, chemical imaging, and property mapping system for both materials and life science applications. The system also provides IR-based chemi...
Bringing new levels of performance, functionality, and AFM accessibility to nanoscale researchers. The Dimension Icon® Atomic Force Microscope brings new levels of performance, functionality, and AFM...
A new chapter in High-Speed AFM: Molecular dynamics in real-time at 50 frames per second
The benchmark for High-Performance Atomic Force Microscopy. It provides high resolution imaging, complete quantitative nanoscale data and is surprisingly simple to operate.
Bruker Nano Surfaces and Metrology provides industry-leading surface and dimensional analysis tools, including AFMs, tribometers and mechanical testers, nanomechanical and nanotribological test instruments, and AFM-IR (nanoIR) technology. Whatever you material or scale of investigation, our broad range of surface analysis instruments can be used to provide solutions for R&D, QA/QC, and failure analysis with speed, accuracy, and ease. Visit www.bruker.com/nano for more information.