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Enter Tecan Competition and Win a Party for your Team!

3 May 2010

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SelectScience Announces Winners of Scientists' Choice Awards at analytica 2010

26 Mar 2010

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New SciFinder® Features Reveal More Synthetic Pathways and Improves Productivity

26 Mar 2010

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2010 analytica Forums Focus on the Latest Hot Topics

15 Mar 2010

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The NEW Q-Scope White Light Interferometer/SPM

23 Dec 2009

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Olympus Offers cell^TIRF™ Microscope Illuminator with Motorized, Simultaneous 4-Channel Image Capture, Quick-Set Penetration Depth

11 Dec 2009

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Achieve Advanced HD Image Capture Without a PC

10 Dec 2009

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Hamamatsu Photonics Announces the ORCA-D2 Dual CCD Camera with Interchangeable Optical Blocks for Simultaneous Dual Wavelength Imaging

10 Dec 2009

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Upgrade a Microscope with a Turnkey Turbo Slide Scanning Solution

9 Dec 2009

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Veeco Introduces the MultiMode 8 High-Performance SPM

7 Dec 2009

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Carl Zeiss MicroImaging to Showcase Four New Microscopy Systems at ASCB 2009

1 Dec 2009

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Nikon Launches New Cooled CCD Digital Camera

27 Nov 2009

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New Digital Camera for Fluorescence Applications

20 Nov 2009

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JPK Announces Integration of Electrochemistry and Optics for the NanoWizard® AFM

27 Oct 2009

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New Thermoscientific.com

22 Aug 2009

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Carl Zeiss Launches User-friendly Software for Quantitative Force Measurement

16 Jul 2009

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JPK Instruments installs first optical tweezers system at Leiden University

9 Jun 2009

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Agar Scientific Provides Source for SPM Accessories

30 Mar 2009

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Veeco Introduces Dimension Icon Atomic Force Microscope Large-Sample AFM with “Small-Sample” Resolution

2 Feb 2009

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JPK Instruments Exhibit Scanning Probe Technologies for Soft Matter and Life Science Research at MICROSCIENCE 2008

1 Jun 2008

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WITec introduce the new alpha500 and 700 – automated confocal raman and atomic force microscope

17 Dec 2007

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Automated 3-D Chemical Imaging Combined with AFM

29 Nov 2007

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XYZ-Piezo-Scanner for AFM Provides 25 Picometers Resolution

1 Apr 2007

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Pacific Nanotechnology introduces Nano-DST advanced platform for AFM research applications

12 Mar 2007

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New Data Sheet Featuring NanoScope® IV SPM Controller Now Available.

14 Oct 2006

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Enter Tecan Competition and Win a Party for your Team!

SelectScience Announces Winners of Scientists' Choice Awards at analytica 2010

New SciFinder® Features Reveal More Synthetic Pathways and Improves Productivity

2010 analytica Forums Focus on the Latest Hot Topics

The NEW Q-Scope White Light Interferometer/SPM

Olympus Offers cell^TIRF™ Microscope Illuminator with Motorized, Simultaneous 4-Channel Image Capture, Quick-Set Penetration Depth

Achieve Advanced HD Image Capture Without a PC

Hamamatsu Photonics Announces the ORCA-D2 Dual CCD Camera with Interchangeable Optical Blocks for Simultaneous Dual Wavelength Imaging

Upgrade a Microscope with a Turnkey Turbo Slide Scanning Solution

Veeco Introduces the MultiMode 8 High-Performance SPM

Carl Zeiss MicroImaging to Showcase Four New Microscopy Systems at ASCB 2009

Nikon Launches New Cooled CCD Digital Camera

New Digital Camera for Fluorescence Applications

JPK Announces Integration of Electrochemistry and Optics for the NanoWizard® AFM

New Thermoscientific.com

Carl Zeiss Launches User-friendly Software for Quantitative Force Measurement

JPK Instruments installs first optical tweezers system at Leiden University

Agar Scientific Provides Source for SPM Accessories

Veeco Introduces Dimension Icon Atomic Force Microscope Large-Sample AFM with “Small-Sample” Resolution

JPK Instruments Exhibit Scanning Probe Technologies for Soft Matter and Life Science Research at MICROSCIENCE 2008

WITec introduce the new alpha500 and 700 – automated confocal raman and atomic force microscope

Automated 3-D Chemical Imaging Combined with AFM

XYZ-Piezo-Scanner for AFM Provides 25 Picometers Resolution

Pacific Nanotechnology introduces Nano-DST advanced platform for AFM research applications

New Data Sheet Featuring NanoScope® IV SPM Controller Now Available.

News & Articles

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Search

Selected Filters:

Enter Tecan Competition and Win a Party for your Team!

SelectScience Announces Winners of Scientists' Choice Awards at analytica 2010

New SciFinder® Features Reveal More Synthetic Pathways and Improves Productivity

2010 analytica Forums Focus on the Latest Hot Topics

The NEW Q-Scope White Light Interferometer/SPM

Olympus Offers cell^TIRF™ Microscope Illuminator with Motorized, Simultaneous 4-Channel Image Capture, Quick-Set Penetration Depth

Achieve Advanced HD Image Capture Without a PC

Hamamatsu Photonics Announces the ORCA-D2 Dual CCD Camera with Interchangeable Optical Blocks for Simultaneous Dual Wavelength Imaging

Upgrade a Microscope with a Turnkey Turbo Slide Scanning Solution

Veeco Introduces the MultiMode 8 High-Performance SPM

Carl Zeiss MicroImaging to Showcase Four New Microscopy Systems at ASCB 2009

Nikon Launches New Cooled CCD Digital Camera

New Digital Camera for Fluorescence Applications

JPK Announces Integration of Electrochemistry and Optics for the NanoWizard® AFM

New Thermoscientific.com

Carl Zeiss Launches User-friendly Software for Quantitative Force Measurement

JPK Instruments installs first optical tweezers system at Leiden University

Agar Scientific Provides Source for SPM Accessories

Veeco Introduces Dimension Icon Atomic Force Microscope Large-Sample AFM with “Small-Sample” Resolution

JPK Instruments Exhibit Scanning Probe Technologies for Soft Matter and Life Science Research at MICROSCIENCE 2008

WITec introduce the new alpha500 and 700 – automated confocal raman and atomic force microscope

Automated 3-D Chemical Imaging Combined with AFM

XYZ-Piezo-Scanner for AFM Provides 25 Picometers Resolution

Pacific Nanotechnology introduces Nano-DST advanced platform for AFM research applications

New Data Sheet Featuring NanoScope® IV SPM Controller Now Available.

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