Products & Reviews

Scanning Electron Microscope

Field Emission Scanning Electron Microscope

High speed and high sensitive analysis was achieved by JEOL’s proprietary technologies. JMS-TQ4000GC was developed with all technologies and experience that were brewed in the development of high-end GC-MS of JEOL.

This 4th generation Neoscope incorporates advanced technology and functions that make it simple for users at any skill level to obtain outstanding SEM images and elemental analysis results in minutes.  It is equipped with a large chamber, high and low vacuum modes, secondary and backscatter electron detectors, real-time 3D imaging, highly-advanced auto functions and the option to add a fully embedded EDS with real-time, ‘Live’…

The JMS-TQ4000GC Triple-Quadrupole Mass Spectrometer accurately measures trace or residual pesticides in agricultural materials, trace levels of regulated chemicals in tap water, and simplifies quantitative analysis of persistent environmental pollutants such as dioxins and PCB’s.

The AccuTOF™-DART® 4G is an atmospheric pressure ionization, high-resolution time-of-flight mass spectrometer (API-HRTOFMS). This robust and versatile mass spectrometer provides solutions for a wide variety of fields with interchangeable atmospheric and ambient ionization sources.

In combination with comprehensive 2D gas chromatography (GCxGC) using the Zoex thermal modulator, the AccuTOF™ GCxGC Mass Spectrometer offers both powerful chromatographic separation and high-resolution mass spectra.

High-vacuum specimen preparation device that makes it easy to prepare samples for imaging and analysis with electron microscopes.

Sputter Coater

Carbon Coater

The JMS-T100LP AccuTOF™ LC-Express 4G Time-of-Flight Mass Spectrometer is based on our award-winning AccuTOF time-of-flight analyzer platform. The AccuTOF analyzer design employs elegant ion optics and an ADC-based digitizer to deliver a dynamic range exceeding 4 orders of magnitude, without compromising sensitivity, resolution or mass accuracy.

Thin Film Specimen Preparation

Multipurpose Analytical S/TEM

Atomic Resolution S/TEM

200kV Monochromated S/TEM

Field Emission EPMA

LaB6 EPMA

Focused Ion Beam Milling & Imaging System

Direct Write E-beam Lithography System

Direct Write E-beam Lithography System

E-Beam Mask/Reticle Writer

Atomic Resolution TEM

Field Emission Cryo-electron Microscope

The new JMS-Q1600GC UltraQuad™ SQ-Zeta Single Quad Mass Spectrometer of JEOL is our 6th generation high-end Gas Chromatograph Quadrupole Mass Spectrometer (GC-QMS) based on JEOL's 50 years of MS technologies and experience.

High-throughput Analytical S/TEM