Profilometers Products & Reviews

Profilometers are instruments used to measure a surface's profile, in order to quantify etch depth, deposited film thickness, and surface roughness. They operate in either contact or non-contact modes and may use optical or stylus techniques to make the actual measurements.

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PolarCam

Laser Physics UK Ltd

PolarCam micropolarizer cameras simultaneously capture multiple polarized images of each video frame, enabling a range of image enhancement techniques. Small, fast and field-proven, these unique cameras suppress or boost data content without image blur, for applications in image enhancement, medical imaging, surface mapping and more. High-resolution PolarCam cameras are available with 1, 2 and 4 mega-pixel sensors, with 7.4 or…

5.0/5.0
|1 Review

TrueSurface Microscopy

Oxford Instruments WITec

True Surface Microscopy - Confocal Microscopy Along with Large Area Optical Profiling WITec´s new True Surface Microscopy option (patent pending) allows confocal Raman imaging guided by surface topography. Confocal microscopy is often desirable due to its suppression of out-of-focus light but can be challenging when analyzing large or rough surfaces. In these cases, only those points that are in focus contribute to the image.…

4.3/5.0
|1 Review
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Dektak® 8 Advanced Development Profiler

VEECO Instruments Inc.

The Dektak® 8 Advanced Development Profiler combines high repeatability, low-force sensor technology, and advanced 3D data analysis for surface characterization of MEMS, semiconductors and other thin/thick films. The system provides 7.5 angstrom, 1 sigma step height repeatability and a vertical range of up to 1mm. Its overhead gantry design enables scan lengths to 200mm, for planarity and flatness measurements.

3.3/5.0
|1 Review

ContourX-500

Bruker Nano Surfaces and Metrology

The ContourX-500 Optical Profilometer is the world’s most comprehensive automated benchtop system for fast, non-contact 3D surface metrology. The gage-capable ContourX-500 boasts unmatched Z-axis resolution and accuracy, and is easily customized for the widest range of complex applications, from QA/QC metrology of precision machined surfaces and semiconductor processes to R&D characterization for ophthalmics and MEMS devices.…

0.0/5.0
|0 Reviews
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DektakXT

Bruker Nano Surfaces and Metrology

The DektakXT stylus profilometer features a revolutionary benchtop design that enables an unmatched repeatability of 4 Å and up to 40% improvement in scanning speeds. The technological breakthroughs incorporated in DektakXT enable critical nanometer-level surface measurements for the microelectronics, semiconductor, solar, high-brightness LED, medical, and materials science industries.

0.0/5.0
|0 Reviews
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