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How to validate automated cell counters: Benefits of using validation slides over NIST standard beads

26 Nov 2025

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Nanobeam 4D STEM with MerlinEM - The intersection between crystallography and microscopy

15 Oct 2025

Scientific Posters

TimePix 4 for imaging

14 Oct 2025

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Software-based segmentation of metallic inclusions of additive manufactured alloys – linking microstructure and materials properties

16 Jul 2025

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Streamline imaging, EDS and analysis

16 Jul 2025

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Connected productivity in the materials lab

16 Jul 2025

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Exploring the benefits of Hitachi’s SU8600 and SU8700 Field Emission SEMs

6 Jun 2025

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Broad ion beam milling with Hitachi’s IM4000II & ArBlade 5000

6 Jun 2025

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Introducing Hitachi’s SU3800SE and SU3900SE SEMs: Simplifying microscopy with easy, automatic operation

6 Jun 2025

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Optimizing SEM sample preparation with broad ion beam milling

6 Jun 2025

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Why electron microscopy is critical for battery research

6 Jun 2025

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The FlexSEM II: High-Resolution SEM Imaging in a surprisingly compact design

6 Jun 2025

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A look at tabletop SEMs

6 Jun 2025

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The importance of high-quality cross-sectioning for battery research

6 Jun 2025

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ArBlade 5000 – An innovative, high-performance sample preparation tool for SEM

7 Apr 2025

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The Hitachi TM4000PlusIII – Bringing high-performance SEM to the tabletop

25 Mar 2025

Product Brochures

Next generation of tabletop electron microscopes

21 Mar 2025

Product Brochures

FlexSEM: The smart little SEM that flexibly adjusts to your skills and needs

11 Feb 2025

Product Brochures

Hitachi Product Catalogue 2024/25- German

11 Feb 2025

Product Brochures

Hitachi Product Catalogue 2024/25- English

11 Feb 2025

Product Brochures

TM4000 Series Tabletop Microscopes

27 Nov 2024

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SE Series Scanning Electron Microscopes

27 Nov 2024

Application Notes

Screening of copolymer nanodiscs with multi-parameter stability characterization on the Prometheus Panta

9 Oct 2024

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Your guide to EDS analysis in electron microscopy

29 Jul 2024

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Trends in biomaterials imaging

29 Jul 2024

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How to validate automated cell counters: Benefits of using validation slides over NIST standard beads

Nanobeam 4D STEM with MerlinEM - The intersection between crystallography and microscopy

TimePix 4 for imaging

Software-based segmentation of metallic inclusions of additive manufactured alloys – linking microstructure and materials properties

Streamline imaging, EDS and analysis

Connected productivity in the materials lab

Exploring the benefits of Hitachi’s SU8600 and SU8700 Field Emission SEMs

Broad ion beam milling with Hitachi’s IM4000II & ArBlade 5000

Introducing Hitachi’s SU3800SE and SU3900SE SEMs: Simplifying microscopy with easy, automatic operation

Optimizing SEM sample preparation with broad ion beam milling

Why electron microscopy is critical for battery research

The FlexSEM II: High-Resolution SEM Imaging in a surprisingly compact design

A look at tabletop SEMs

The importance of high-quality cross-sectioning for battery research

ArBlade 5000 – An innovative, high-performance sample preparation tool for SEM

The Hitachi TM4000PlusIII – Bringing high-performance SEM to the tabletop

Next generation of tabletop electron microscopes

FlexSEM: The smart little SEM that flexibly adjusts to your skills and needs

Hitachi Product Catalogue 2024/25- German

Hitachi Product Catalogue 2024/25- English

TM4000 Series Tabletop Microscopes

SE Series Scanning Electron Microscopes

Screening of copolymer nanodiscs with multi-parameter stability characterization on the Prometheus Panta

Your guide to EDS analysis in electron microscopy

Trends in biomaterials imaging

Resources

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Selected Filters:

How to validate automated cell counters: Benefits of using validation slides over NIST standard beads

Nanobeam 4D STEM with MerlinEM - The intersection between crystallography and microscopy

TimePix 4 for imaging

Software-based segmentation of metallic inclusions of additive manufactured alloys – linking microstructure and materials properties

Streamline imaging, EDS and analysis

Connected productivity in the materials lab

Exploring the benefits of Hitachi’s SU8600 and SU8700 Field Emission SEMs

Broad ion beam milling with Hitachi’s IM4000II & ArBlade 5000

Introducing Hitachi’s SU3800SE and SU3900SE SEMs: Simplifying microscopy with easy, automatic operation

Optimizing SEM sample preparation with broad ion beam milling

Why electron microscopy is critical for battery research

The FlexSEM II: High-Resolution SEM Imaging in a surprisingly compact design

A look at tabletop SEMs

The importance of high-quality cross-sectioning for battery research

ArBlade 5000 – An innovative, high-performance sample preparation tool for SEM

The Hitachi TM4000PlusIII – Bringing high-performance SEM to the tabletop

Next generation of tabletop electron microscopes

FlexSEM: The smart little SEM that flexibly adjusts to your skills and needs

Hitachi Product Catalogue 2024/25- German

Hitachi Product Catalogue 2024/25- English

TM4000 Series Tabletop Microscopes

SE Series Scanning Electron Microscopes

Screening of copolymer nanodiscs with multi-parameter stability characterization on the Prometheus Panta

Your guide to EDS analysis in electron microscopy

Trends in biomaterials imaging

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