Hysitron PI 89
The Hysitron PI 89 SEM PicoIndenter leverages the advanced imaging capabilities of scanning electron microscopes (SEM, FIBSEM, PFIB), making it possible to perform quantitative nanomechanical testing while simultaneously imaging. Enabled testing techniques include nanoindentation, tensile testing, pillar compression, particle compression, cantilever bending, fracture, fatigue, dynamic testing, and mechanical properties mappin…
Hysitron PI 89 SEM PicoIndenter
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Robust, precise, and modular in-situ SEM nanomechanical testing instrument.
As a leader in nanomechanical testing systems, Bruker makes it easy for you to conduct in-situ mechanical experiments in your scanning electron microscope (SEM) or transmission electron microscope (TEM) with the Hysitron PI Series PicoIndenters. Our unique transducer design delivers unmatched stability throughout your experiments, resulting in precise data even at the nanoscale. Video capture from the microscope enables real-time monitoring and direct correlation of mechanical data to microscope imaging.
Advanced versatility for testing in extreme environments:
- Truly quantitative nanoscale mechanical characterization with direct observation, and up to 3.5 N load and 150 µm displacement
- Encoded XYZ sample positioning with optional tilt and rotation stage
- Modular design supports our full suite of testing techniques, including 1000°C heating, scratch, electrical characterization, scanning probe microscopy (SPM) imaging, XPM property mapping, fatigue/nanodynamic, and more
