Scanning Electron Microscopes (SEM) Products & Reviews

Scanning nitrogen-vacancy magnetometry

Desktop SEM with increased chamber size for large samples up to 100 mm x 100 mm.

FE-SEM for high-quality imaging & advanced analytical microscopy

The World's Fastest Scanning Electron Microscopes.

Your Interactive SEM for Multi-User Environments

The World’s Fastest Scanning Electron Microscopes  

The S-3700N features an ultra large specimen chamber and stage to allow observation of specimens at diameters up to 300mm. Hitachi Variable Pressure SEM (VP-SEM) series have been received with high reputation from customers around the world. They feature low vacuum observation method (6 – 270 Pa) which enables observation of non-conductive samples like electronic components, and water containing samples such as cultured cells,…

The HD-2700 is the top-of-the-range STEM featuring optional spherical aberration correction developed in collaboration with CEOS GmbH ot offer significantly improved resolution and analytical sensitivity. By correcting the spherical aberration resolution of less than 0.1 nm can be achieved in dark-field STEM mode. The Cs corrector is field retrofittable for any HD-2700 system that was originally ordered without the Cs correcto…

The SU9000 Ultra High Resolution FE-SEM is Hitachi's new premium UHR FE-SEM. It features unique electron optics, with the sample positioned inside a gap of the split objective lens pole piece. This so-called true inlens concept - combined with the next generation of HITACHI's cold field emission technology - guarantees the highest possible imaging resolution (0.4nm @ 30kV, 1.2nm @ 1kV) and stability. To make this resolving pow…

Hitachi VP-SEM SU1510 - Top performance in very compact size The new Hitachi SU1510 VP-SEM combines the high-performance electron optics of the S-3400N and S-3700N with an ultra-compact design. Its main body is only 55cm wide, and unlike conventional SEM design concepts the SU1510 does not require a special display and operating console - instead, monitor and PC controls can be conveniently placed on any user prepared workspac…

This 4th generation Neoscope incorporates advanced technology and functions that make it simple for users at any skill level to obtain outstanding SEM images and elemental analysis results in minutes.  It is equipped with a large chamber, high and low vacuum modes, secondary and backscatter electron detectors, real-time 3D imaging, highly-advanced auto functions and the option to add a fully embedded EDS with real-time, ‘Live’…

A complete SEM for multi-user laboratories requiring all-around performance and ease-of-use.

Field Emission EPMA

LaB6 EPMA

Scanning Electron Microscope with exceptional fidelity at any kV

Field Emission Auger Microprobe

The Thermo Scientific™ Apreo™ 2 SEM expands access to high-performance imaging and analytics to all levels of microscopy expertise.

Thermo Scientific™ Helios™ G4 PFIB delivers unmatched capabilities for large volume 3D characterization, Ga+free sample preparation and precise micromachining.

The Thermo Scientific™ Helios 5 Hydra UX DualBeam is part of the fifth generation of the industry-leading Helios DualBeam family. 

Thermo Scientific™ HeliScan™ brings a new era of microCT to Materials Science by leveraging advanced helical scanning and iterative reconstruction technology to produce unsurpassed image fidelity. 

Desktop SEM enabling high quality steel manufacturing through failure analysis and process improvement.

Desktop SEM for additive manufacturing analysis, capable of observing large samples up to 100 mm x 100 mm.

Component cleanliness analysis with a multi-purpose desktop SEM.

SEM EDX gunshot residue analysis (GSR analysis) with desktop SEM.

The Thermo Scientific™ Phenom™ Pharos is a desktop SEM with an FEG source that makes crisp, high-brightness images and the benefits of an FEG source accessible to everyone.