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New Extended NIR Spectral Range of Auto SE

22 Jun 2010

Product News

Horiba Announces Rapid Microfluorescence Dynamics Imaging System - DynaMyc

22 Mar 2010

Product News

New Interferometric Camera Offers Enhanced Dry Etch Endpoint Control

31 May 2009

Product News

Launching the MM-16 NIR, New Spectroscopic Ellipsometer for Thin Film Applications in the Near Infra Red

7 May 2009

Product News

Too many lines, not enough time? Just CLIP them!

16 Apr 2009

Product News

GD Profiler HTP – A New Elemental Analysis Tool For Heat Treatment Process Control

6 Feb 2009

Product News

Too many lines, not enough time? CLIP can help you!

6 Feb 2009

Product News

New SmartView Provides Reliable Semi-quantitative ICP-AES Analysis

6 Feb 2009

Product News

Powerful DeltaPsi2 Software Platform for Ellipsometry, Reflectometry and Polarimetry by HORIBA Jobin Yvon

13 Nov 2008

Product News

UVISEL+ RM: Spectroscopic Ellipsometer + with Integrated Reflectometry Module

8 Jul 2008

Product News

PSA300 Particle Size and Shape Analyser - Measures Exactly What You See

22 Jun 2008

Product News

ACTIVA-S: An affordable, easy-to-use solution for ICP-AES analysis

20 Mar 2008

Product News

HORIBA Jobin Yvon introduce the XploRA™ – the Smart Raman Microscope

13 Mar 2008

Product News

SLICE: A New XRF Methodology and Library for Sample Identification and Archiving

17 Dec 2007

Product News

Raman Imaging at the Speed of Light: SWIFT™ and DuoScan™ – New Fast Scanning Raman Technology

9 Nov 2007

Product News

Worldwide distribution of SPRi-Lab+™ and SPRi-Plex™: Label-free and real-time optical detection

12 Sept 2007

Product News

High performance Raman microscopy made easy

12 Sept 2007

Product News

New FluoroMax<sup>®</sup>-4 Bench-top Spectrofluorometer

12 Sept 2007

Product News

LA-950V2 Partica Particle Size Analyzer

12 Sept 2007

Product News

The XGT-7000 XRF Imaging Microscope with 10 μm resolution

9 Sept 2007

Product News

Innovative Instrument for Fluorescence Dynamics Wins R&D 100 Award

9 Sept 2007

Product News

CLUE: Spectroscopic Accessory for SEMs

15 Aug 2007

Product News

Because Breaking Up is Hard to Do, Try the New Freezer Mill

22 Jul 2007

Product News

HORIBA Jobin Yvon Multichannel Detectors for every Occasion

4 Apr 2007

Product News

iHR550 Imaging Spectrometer

29 Aug 2006

News & Articles

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Selected Filters:

New Extended NIR Spectral Range of Auto SE

Horiba Announces Rapid Microfluorescence Dynamics Imaging System - DynaMyc

New Interferometric Camera Offers Enhanced Dry Etch Endpoint Control

Launching the MM-16 NIR, New Spectroscopic Ellipsometer for Thin Film Applications in the Near Infra Red

Too many lines, not enough time? Just CLIP them!

GD Profiler HTP – A New Elemental Analysis Tool For Heat Treatment Process Control

Too many lines, not enough time? CLIP can help you!

New SmartView Provides Reliable Semi-quantitative ICP-AES Analysis

Powerful DeltaPsi2 Software Platform for Ellipsometry, Reflectometry and Polarimetry by HORIBA Jobin Yvon

UVISEL+ RM: Spectroscopic Ellipsometer + with Integrated Reflectometry Module

PSA300 Particle Size and Shape Analyser - Measures Exactly What You See

ACTIVA-S: An affordable, easy-to-use solution for ICP-AES analysis

HORIBA Jobin Yvon introduce the XploRA™ – the Smart Raman Microscope

SLICE: A New XRF Methodology and Library for Sample Identification and Archiving

Raman Imaging at the Speed of Light: SWIFT™ and DuoScan™ – New Fast Scanning Raman Technology

Worldwide distribution of SPRi-Lab+™ and SPRi-Plex™: Label-free and real-time optical detection

High performance Raman microscopy made easy

New FluoroMax<sup>®</sup>-4 Bench-top Spectrofluorometer

LA-950V2 Partica Particle Size Analyzer

The XGT-7000 XRF Imaging Microscope with 10 μm resolution

Innovative Instrument for Fluorescence Dynamics Wins R&D 100 Award

CLUE: Spectroscopic Accessory for SEMs

Because Breaking Up is Hard to Do, Try the New Freezer Mill

HORIBA Jobin Yvon Multichannel Detectors for every Occasion

iHR550 Imaging Spectrometer

News & Articles

Articles FilterArticles Filter

Search

Selected Filters:

New Extended NIR Spectral Range of Auto SE

Horiba Announces Rapid Microfluorescence Dynamics Imaging System - DynaMyc

New Interferometric Camera Offers Enhanced Dry Etch Endpoint Control

Launching the MM-16 NIR, New Spectroscopic Ellipsometer for Thin Film Applications in the Near Infra Red

Too many lines, not enough time? Just CLIP them!

GD Profiler HTP – A New Elemental Analysis Tool For Heat Treatment Process Control

Too many lines, not enough time? CLIP can help you!

New SmartView Provides Reliable Semi-quantitative ICP-AES Analysis

Powerful DeltaPsi2 Software Platform for Ellipsometry, Reflectometry and Polarimetry by HORIBA Jobin Yvon

UVISEL+ RM: Spectroscopic Ellipsometer + with Integrated Reflectometry Module

PSA300 Particle Size and Shape Analyser - Measures Exactly What You See

ACTIVA-S: An affordable, easy-to-use solution for ICP-AES analysis

HORIBA Jobin Yvon introduce the XploRA™ – the Smart Raman Microscope

SLICE: A New XRF Methodology and Library for Sample Identification and Archiving

Raman Imaging at the Speed of Light: SWIFT™ and DuoScan™ – New Fast Scanning Raman Technology

Worldwide distribution of SPRi-Lab+™ and SPRi-Plex™: Label-free and real-time optical detection

High performance Raman microscopy made easy

New FluoroMax<sup>®</sup>-4 Bench-top Spectrofluorometer

LA-950V2 Partica Particle Size Analyzer

The XGT-7000 XRF Imaging Microscope with 10 μm resolution

Innovative Instrument for Fluorescence Dynamics Wins R&D 100 Award

CLUE: Spectroscopic Accessory for SEMs

Because Breaking Up is Hard to Do, Try the New Freezer Mill

HORIBA Jobin Yvon Multichannel Detectors for every Occasion

iHR550 Imaging Spectrometer

Articles Filter