Electron Microscopy Products & Reviews

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Electron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.

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Themis TEM

Thermo Fisher Scientific

Based on Thermo Scientific™ Titan S/TEM platform – introduced in 2005 – the Themis TEM family forms the next generation of some of the world's most powerful, commercially available suite of S/TEM solutions for Materials Science, with Themis Z and Themis ETEM.

3.3/5.0
|1 Review


ZEISS ZEMAS

ZEISS Research Microscopy Solutions

ZEISS Electron Microscopy Application Software for TEM With ZEMAS software you easily acquire and analyse data with ZEISS LIBRA series transmission electron microscopes. Profit from an experiment driven workflow interface including the complete system integration of all TEM components. Data handling, processing and archiving is built on a database architecture providing a solid base for multi-user, high-throughput instrument u…

0.0/5.0
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ZEISS Atlas 5

ZEISS Research Microscopy Solutions

Large area imaging for SEM, FE-SEM & FIB-SEM ATLAS combines a 16 bit scan generator and dual super-sampling signal acquisition hardware with image processing and control software for your ZEISS electron microscope. Acquire images up to 32 k x 32 k pixels, with dwell times from 100 ns to > 100 s, adjustable in 100 ns increments. Save your images with eight or sixteen bits of intensity. With the ATLAS “Mosaic Tool” you create la…

0.0/5.0
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Symmetry® S3

Oxford Instruments

The Symmetry S3 is the only genuine all-in-one EBSD detector on the market, and is based on the revolutionary Symmetry detector, the world’s first EBSD detector to utilise advanced CMOS technology.

0.0/5.0
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H-9500, high performance TEM

Hitachi High Technologies America, Inc.

The H-9500 is a high performance TEM featuring a single crystal LaB6 electron source. This allows 0.102 nm crystal lattice resolution and 0.18 nm point to point to be achieved. The instrument features a low magnification operating mode of x200 to x500 and a high magnification mode with zoom from x1000 to x1,500,000. Fully PC-controlled, the instrument has an icon-driven user interface and is designed for very fast operation. W…

0.0/5.0
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S-3700N Ultra Large VP-SEM

Hitachi High Technologies America, Inc.

The S-3700N features an ultra large specimen chamber and stage to allow observation of specimens at diameters up to 300mm. Hitachi Variable Pressure SEM (VP-SEM) series have been received with high reputation from customers around the world. They feature low vacuum observation method (6 – 270 Pa) which enables observation of non-conductive samples like electronic components, and water containing samples such as cultured cells,…

0.0/5.0
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HT7700 120 kV Automated TEM

Hitachi High Technologies America, Inc.

Hitachi offers the sleek HT7700 for maximum performance and productivity. The radical design incorporates the ergonomics and user friendliness of a SEM with advanced automation, resolution and analytical capabilities of a TEM. Imaging is completely digital – you won’t find a viewing or projector chamber - and Hitachi’s EMIP-SP database software automatically catalogues your single frame and montaged images. The turbopump evacu…

0.0/5.0
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HD-2700 Cs Corrected STEM

Hitachi High Technologies America, Inc.

The HD-2700 is the top-of-the-range STEM featuring optional spherical aberration correction developed in collaboration with CEOS GmbH ot offer significantly improved resolution and analytical sensitivity. By correcting the spherical aberration resolution of less than 0.1 nm can be achieved in dark-field STEM mode. The Cs corrector is field retrofittable for any HD-2700 system that was originally ordered without the Cs correcto…

0.0/5.0
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HF-3300 300 kV FE TEM

Hitachi High Technologies America, Inc.

The HF-3300 300 kV FE TEM is a powerful analytical and high resolution TEM/STEM with inherent high beam brightness, high coherence, high energy resolution, and Hitachi unique functions! Features • High energy-resolution and high beam current • Parallel nanobeam electron diffraction for high precision stress analysis • Spatially-resolved EELS for instant multipoint compositional and chemical binding state analyses • Double-bipr…

0.0/5.0
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NB5000 nanoDUE'T FIB-SEM

Hitachi High Technologies America, Inc.

The Hitachi NB5000 FIB-SEM integrates a superior 40kV Ga ion FIB column with an ultra-high-resolution Schottky FE-SEM. Like all our products, all components have been designed with consideration of the total system performance. This results in exceptional stability, milling performance and resolution, allowing e.g. automated mill-and-monitor operations for 3D reconstructions with slicing steps down to 5nm. NB5000 incorporate…

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IM4000 Ion Milling System

Hitachi High Technologies America, Inc.

The Hitachi IM4000 Ar Ion Milling System offers two milling configurations available in a single instrument: cross section cutting and wide-area sample surface fine polishing. The new Ar ion gun design, with increased milling rate (300µm/h for Si), affords reduced cross section processing times by as much as 65%. For added convenience, the IM4000 sample stage unit can be removed for specimen setting and cross section edge fine…

0.0/5.0
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ZONE Desktop Sample Cleaner and Desiccator for SEM/TEM

Hitachi High Technologies America, Inc.

Sample surfaces are inevitably coated with hydrocarbon contamination due to sample preparation or from storage. The ZONE desktop sample cleaner/desiccator gently removes contaminations to reveal the true surface of your specimens. There are Two Models ZoneSEM ZoneSEM's sample holder stage was designed for Hitachi Type I and Type II carriers. Adjustable height and optional holders available. Provides effective cleaning of surfa…

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