Electron Microscopy Products & Reviews

SEM EDS instrument that is flexible, easy to use, and offers instantaneous, quantitative elemental analysis.

Desktop SEM with increased chamber size for large samples up to 100 mm x 100 mm.

FE-SEM for high-quality imaging & advanced analytical microscopy

Based on Thermo Scientific™ Titan S/TEM platform – introduced in 2005 – the Themis TEM family forms the next generation of some of the world's most powerful, commercially available suite of S/TEM solutions for Materials Science, with Themis Z and Themis ETEM.

in situ Transmission Electron Microscope

Next generation sample preparation for cryo-EM 

The CLUE (Cathodo-Luminescence Universal Extension) series is designed for use in materials science, mineralogy, geology, life sciences and forensics applications. They interface with any Scanning Electron Microscopes (SEM) and dual SEM/Focused Ion Beam (FIB) microscopes, are fully automated, modular for easy upgrade and offer the widest spectral range available (UV-Vis-IR).  

Your Interactive SEM for Multi-User Environments

Large area imaging for SEM, FE-SEM & FIB-SEM ATLAS combines a 16 bit scan generator and dual super-sampling signal acquisition hardware with image processing and control software for your ZEISS electron microscope. Acquire images up to 32 k x 32 k pixels, with dwell times from 100 ns to > 100 s, adjustable in 100 ns increments. Save your images with eight or sixteen bits of intensity. With the ATLAS “Mosaic Tool” you create la…

ZEISS Electron Microscopy Application Software for TEM With ZEMAS software you easily acquire and analyse data with ZEISS LIBRA series transmission electron microscopes. Profit from an experiment driven workflow interface including the complete system integration of all TEM components. Data handling, processing and archiving is built on a database architecture providing a solid base for multi-user, high-throughput instrument u…

Speed Up Your Correlative Workflow.

The World's Fastest Scanning Electron Microscopes.

The World’s Fastest Scanning Electron Microscopes  

The Triple Ion Beam Cutter, Leica EM TIC 3X allows production of cross sections of hard/soft, porous, heat sensitive, brittle and heterogeneous material for Scanning Electron Microscopy (SEM), Microstructure Analysis (EDS, WDS, Auger, EBSD) and, AFM investigations. 

Ensure the ultrastructures of your tissue samples can be precisely compared every time by preparing them with the EM TP tissue processor. 

Correlating Cryofixed Biological Samples in the Light- and Electron Microscope.

The Leica EM TXP is a target preparation device for milling, sawing, grinding, and polishing samples prior to examination by SEM, TEM, and LM techniques.

Developed in cooperation with leading scientists, the EM ACE coater family covers all the requirements for your sample preparation needs, from coating to freeze fracture. 

Leica's cryo-electron tomography workflow solution: boost your productivity with a seamless sample preparation workflow.

This 4th generation Neoscope incorporates advanced technology and functions that make it simple for users at any skill level to obtain outstanding SEM images and elemental analysis results in minutes.  It is equipped with a large chamber, high and low vacuum modes, secondary and backscatter electron detectors, real-time 3D imaging, highly-advanced auto functions and the option to add a fully embedded EDS with real-time, ‘Live’…

High-vacuum specimen preparation device that makes it easy to prepare samples for imaging and analysis with electron microscopes.

Sputter Coater

Carbon Coater

Thin Film Specimen Preparation

Multipurpose Analytical S/TEM