Atomic Force Microscopy / Scanning Tunneling Microscopy Products & Reviews

The WITec alpha300 RA correlative microscope fuses the most powerful chemical and topographic imaging techniques into one fully-integrated instrument.  

The most accurate and high-resolution Atomic Force Microscope for small sample research

Based on the popular Keysight 5400 AFM, the 5420 has been re-engineered to provide lower noise, better performance, and greater versatility. Featuring a new ergonomic design and improved electronics, this scientific-grade microscope delivers atomic-scale resolution at a remarkably affordable price. The 5420 offers a simple cost-effective upgrade program that includes choice of open loop and closed loop scanners, STM scanner…

World's Ultimate AFM The new benchmark for speed with highest resolution and performanceThe Dimension FastScan™ delivers, for the first time, extreme imaging speed without loss of resolution, loss of force control, added complexity, or additional operating costs.This tip-scanning system provides measurements on both large and small size samples in air or fluids. With the FastScan you can achieve immediate atomic force microsc…

Bringing new levels of performance, functionality, and AFM accessibility to nanoscale researchers. The Dimension Icon® Atomic Force Microscope brings new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. The culmination of decades of large-sample AFM technology, the system has been designed from top to bottom to deliver revolutionary low drift and low noise that allo…

A new chapter in High-Speed AFM: Molecular dynamics in real-time at 50 frames per second

MultiMode 8 Scanning Probe Microscope from Veeco Instruments The World's Highest Resolution, Most Published SPM Just Got Better The MultiMode® 8 Scanning Probe Microscope (SPM) resets the standard for high-performance SPMs. A major advancement of the world's best-selling, most field-proven SPM platform, the MultiMode 8 SPM features two new patent-pending technologies from Veeco, ScanAsyst™ and PeakForce™ QNM™, as well as a sim…

Cypher™ AFM - The World's Highest Resolution AFM Asylum Research introduces the Cypher AFM, the industry’s first completely new small sample AFM/SPM in over a decade. Cypher AFM from Asylum Research - Decode the Nanoworld with the Next Generation of AFM Cypher is the world’s highest resolution AFM. The Cypher AFM achieves closed loop atomic resolution using sensors in all three axes, combining the accuracy and control of c…

Scanning nitrogen-vacancy magnetometry

WITec’s alpha300 S pushes the range of optical microscopy beyond the diffraction limit. 

Scanning Probe Microscope Series WITec alpha300 The WITec microscopy series features scanning probe as well as high resolution optical and Raman microscopy techniques in either a single instrument or combined system configurations for the highest flexibility throughout a wide range of microscopy applications. For example, it is possible to start with Confocal Raman Microscopy and upgrade later to Atomic Force Microscopy or vic…

The next-generation automatic Atomic Force Microscope for academic research

Atomic Force Microscopy for Patterned Sapphire Substrates Delivering advanced automated metrology and production capabilities with superior resolution for now and the future. Bruker's Dimension Edge™ PSS Atomic Force Microscope with AutoMET™ Metrology Analysis Software is the ideal nano-metrology and nano-inspection system for LED substrate and epitaxial manufacturers. As an extension of the Dimension Edge AFM platform, the Ed…

The BioScope Catalyst™ BioAFM is designed specifically to best answer the unique requirements of biologists, biophysicists, and bioengineers. It combines top AFM performance with unprecedented simplicity for research applications where tight integration of AFM with light microscopy is enabling tomorrow’s new discoveries.The Catalyst incorporates all of Bruker's latest PeakForce Tapping™ innovations, including the new Nanomech…

The benchmark for High-Performance Atomic Force Microscopy. It provides high resolution imaging, complete quantitative nanoscale data and is surprisingly simple to operate.

The Keysight 5500 AFM/SPM microscope offers numerous unique features, such as patented top-down scanning and unrivalled environmental and temperature control, while providing maximum flexibility and modularity. The universal microscope base permits easy integration with an environmental chamber or an inverted optical microscope. Sample preparation is made easy with our unique sample plates designed for your application includi…

Silicon nitride probes for contact, fluid tapping mode and force measurement, with a variety of extremely low spring constants for high force sensitivity. Sharpened; 6 cantilevers 0.01-0.50N/m; Au Reflective Coating. Tip Specification Sharpened Microlevers Geometry: Cast Tip Height (h): 2.5 - 8.0µm Front Angle (FA): 15 ± 2.5° Back Angle (BA): 25 ± 2.5° Side Angle (SA): 22.5 ± 2.5° Tip Radius (Nom): 10nm Tip Radius (Max): 40nm…

Asylum Research MFP-3D™ Stand Alone AFM  - The Widest Range of AFM/SPM Capabilities Available Today The Atomic Force Microscope (AFM), has been the instrument of choice for three dimensional measurements at the nanometer scale. With the Asylum Research MFP-3D Stand Alone (MFP-3D-SA) AFM, scientists can now choose a sensitive and precise AFM with the lowest noise performance that also includes a complete scientific software en…

AFM-Raman System from Renishaw - Extend your understanding of the nanoscale Renishaw has optimised direct coupling technology, making the inVia Raman microscope the perfect partner for coupling to a wide variety of Scanning Probe Microscopes (SPMs), offering Tip Enhanced Raman Spectroscopy (TERS), near-field techniques (SNOM, NSOM) and Raman-AFM capabilities. The inVia Raman microscope offers potential for coupling to any SPM…

ICnano® provides a simple, robust and reliable system for scanning ion conductance microscopy (SICM) - the ideal technique for high resolution imaging of: • living cell membranes • soft or fragile surface features • any surface, whether organic or inorganic, that is immersed in electrolyte The ICnano® is ionscope's first product based on modulated probe ion conductance scanning - developed with a team at Imperial College Londo…

The WITec alpha300 A atomic force microscope features exceptional capability along with an uncommon versatility.

High vacuum Atomic Force Microscope for failure analysis applications and ?atmosphere-sensitive materials research

The most affordable research grade Atomic Force Microscope with flexible sample handling

The leading automated nanometrology tool for 300 mm wafer measurement and analysis

NX-Wafer is the wafer fab Atomic Force Microscope with automatic defect review (ADR) that improves defect review productivity by up to 1,000%